| Literature DB >> 32226980 |
Kwan-Ho Kim1, Hyung-Youl Park1, Jaewoo Shim2, Gicheol Shin3, Maksim Andreev1, Jiwan Koo1, Gwangwe Yoo1, Kilsu Jung1, Keun Heo1, Yoonmyung Lee3, Hyun-Yong Yu4, Kyung Rok Kim5, Jeong Ho Cho6, Sungjoo Lee7, Jin-Hong Park7.
Abstract
For increasing the restricted bit-density in the conventional binary logic system, extensive research efforts have been directed toward implementing single devices with a two threshold voltage (VTH) characteristic via the single negative differential resistance (NDR) phenomenon. In particular, recent advances in forming van der Waals (vdW) heterostructures with two-dimensional crystals have opened up new possibilities for realizing such NDR-based tunneling devices. However, it has been challenging to exhibit three VTH through the multiple-NDR (m-NDR) phenomenon in a single device even by using vdW heterostructures. Here, we show the m-NDR device formed on a BP/(ReS2 + HfS2) type-III double-heterostructure. This m-NDR device is then integrated with a vdW transistor to demonstrate a ternary vdW latch circuit capable of storing three logic states. Finally, the ternary latch is extended toward ternary SRAM, and its high-speed write and read operations are theoretically verified.Entities:
Year: 2020 PMID: 32226980 DOI: 10.1039/c9nh00631a
Source DB: PubMed Journal: Nanoscale Horiz ISSN: 2055-6756 Impact factor: 10.989