Mesoporous silica features open and accessible pores that can intake substances from the outside. The combination of mesoporous silica with plasmonic nanostructures represents an interesting platform for an optical sensor based on the dependence of plasmonic modes on the refractive index of the medium in which metallic nanoparticles are embedded. However, so far only a limited number of plasmonic nanostructures are combined with mesoporous silica, including random dispersion of metallic nanoparticles and flat metallic thin films. In this study, we make a mesoporous silica layer on an aluminum nanocylinder array. Such plasmonic arrangements support both localized surface plasmon resonances (LSPRs) and extended modes which are the result of the hybridization of LSPRs and photonic modes extending into the mesoporous layer. We investigate in situ optical reflectance of this system under controlled pressure of isopropanol vapor. Upon exposure, the capillary condensation in the mesopores results in a gradual spectral shift of the reflectance. Our analysis demonstrates that such shifts depend largely on the nature of the modes; that is, the extended modes show larger shifts compared to localized ones. Our materials represent a useful platform for the field of environmental sensing.
Mesoporous silica features open and accessible pores that can intake substances from the outside. The combination of mesoporous silica with plasmonic nanostructures represents an interesting platform for an optical sensor based on the dependence of plasmonic modes on the refractive index of the medium in which metallic nanoparticles are embedded. However, so far only a limited number of plasmonic nanostructures are combined with mesoporous silica, including random dispersion of metallic nanoparticles and flat metallic thin films. In this study, we make a mesoporous silica layer on an aluminum nanocylinder array. Such plasmonic arrangements support both localized surface plasmon resonances (LSPRs) and extended modes which are the result of the hybridization of LSPRs and photonic modes extending into the mesoporous layer. We investigate in situ optical reflectance of this system under controlled pressure of isopropanol vapor. Upon exposure, the capillary condensation in the mesopores results in a gradual spectral shift of the reflectance. Our analysis demonstrates that such shifts depend largely on the nature of the modes; that is, the extended modes show larger shifts compared to localized ones. Our materials represent a useful platform for the field of environmental sensing.
Porous photonic structures
are a class of resonant materials where
pores or voids play a critical role in their optical properties.[1] Open porosity accessible from the outside can
be used as a room to store materials to enhance/modulate the optical
response. In particular, magnetic,[2] plasmonic,[3,4] luminescent,[5] and phase transition[6−8] materials have been incorporated into pores. Also, it allows porous
photonic structures to respond to changes in the surrounding environment,
as it has been demonstrated in one-[9−12] and three-dimensional[13−15] photonic crystals, where a shift in the optical response is observed
as a result of vapor adsorption.Plasmonic nanostructures are
another class of systems that respond
to the environment: The excitation condition of a surface plasmon
polariton (SPP), a plasma oscillation on the metallic surface coupled
to a lightwave,[16] varies with the refractive
index of the surroundings. Thus, adsorption of molecules on the surface
of metallic nanostructures may result in the spectral shift in resonant
condition. Chemical- and antibody-modified metallic thin films[17,18] and nanoparticles[19−21] are well-studied examples to detect target molecules
in solution. For the vapor and gas sensing, there are also SPP-enhanced
sensing systems.[22−29]A combination of porous materials with advanced plasmonic
nanostructures
should make a unique system that shows environmental sensing ability.
In particular, mesoporous silica (MPS) represents an interesting choice
because the mesoscale pores do not scatter visible light to smear
out the plasmonic resonances, although there is only limited number
of examples that combine mesoporous materials with plasmonic thin
films[30] and nanostructures. A periodic
plasmonic array, where Al nanocylinders are arranged in a period comparable
to the wavelength of light,[31] supports
localized surface plasmon resonances (LSPRs). In addition, it could
support the hybrid modes; that is, the coherent in-plane light scattering
results in the strong radiative coupling between LSPRs. Covering such
an array with a layer of transparent MPS makes a system where light
energy is trapped inside the layer with accessible pores. Although
it is known that optical modes sustained by such systems can be tuned
by the refractive index of the layer deposited atop,[31] an in situ response of such a plasmonic–photonic
hybrid structure has never been explored.In this study, we
examine the in situ response
of an MPS layer deposited over an Al nanocylinder array to the environmental
vapor. We select isopropanol (IPA) as the guest compound that can
diffuse and condensate within the pore network of MPS. IPA has been
previously proven to yield excellent results for the analysis of the
vapor sorption properties of mesostructured and nanoparticle-based
multilayers.[32] In addition, accurate adsorption–desorption
isotherms in porous alumina have already been observed and discussed
also by using IPA as a probe.[33,34] The role of MPS as
a molecular catcher and condenser has been elucidated experimentally
by specular reflectance porosimetry,[35,36] where the
reflectance spectra are measured as a function of the IPA pressure.
Compared to the MPS layer on the flat substrate, the MPS layer-on-plasmonic
array shows much distinct spectral features assignable to LSPR and
hybridized modes. We find the difference in the response between the
modes appears in the spectra and relate the difference to the spatial
distribution of the light energy associated with each mode.
Experimental
Section
Preparation of Al Nanocylinder Arrays
Al nanocylinders
arranged in a square lattice with a periodicity of 400 nm were fabricated
by using nanoimprint lithography in combination with reactive ion
etching (RIE). The height of the nanocylinders was 200 nm, and their
diameter was 200 nm. The fabrication procedure is as follows. First,
a resist layer was deposited on a thin film of Al. Then, the surface
of the resist was nanostructured by nanoimprint techniques (EntreTM3,
Obducat), replicating the surface morphology of a Si mold. The sample
was then structured by RIE (RIE-101iPH, Samco). The array structures
were examined by using a scanning electron microscope (SU8000, Hitachi).
Preparation of an MPS Layer on the Al Array
The MPS
layer was designed to comprise cylindrical pores packed hexagonally
with the long axis being aligned parallel to the surface.[37] First, poly(ethylene glycol)-block-poly(propylene glycol)-block-poly(ethylene glycol),
HO(CH2CH2O)20(CH2CH(CH3)O)70(CH2CH2O)20H (Pluronic123, 5.50 g), was dissolved in ethanol
(20.28 mL). Next, tetraethoxysilane (TEOS, 10.7 mL), 0.1 M aqueous
solutions of hydrochloric acid (1.08 mL), water (9.72 mL), and ethanol
(30.4 mL) were stirred vigorously in another vessel for 20 min. Then,
these solutions were mixed and stirred for 3 h. This mixture was used
as a precursor solution. The Al nanocylinder array was dip-coated
with the precursor solution to form an MPS layer. After evaporation
of the solvent, the sample was heated at a rate of 1 °C/min to
400 °C and then held for 4 h to remove the surfactant inside
the pores. The thickness of the MPS layer was evaluated by a stylus
profiler (ASIQ, KLA Tencor) to be ca. 700 nm.
Specular Reflectance Porosimetry
The specular reflectance
was measured under controlled pressure of IPA. To control the vapor
pressure in the sample chamber, a container with liquid IPA was connected
to the chamber through a needle valve. The internal pressure of the
chamber was measured with a dual capacitance manometer (MKS model
PDR 2000). Samples were annealed at 200 °C for 1 h to remove
any moisture from the voids in the porous structures before carrying
out the gas adsorption–desorption process. The chamber containing
a sample was kept under dynamic vacuum (10–2 Torr)
for 30 min. In adsorption measurements, IPA gas was injected into
the chamber, and the reflectance spectra were measured at each fixed
pressure, P, by using a FTIR spectrometer (IFS-66,
Bruker). This process was repeated sequentially at different vapor
pressures until saturation pressure (Ps) was reached. Desorption experiments were conducted following the
same protocol, with a gradual decrease in the pressure being obtained
by opening the valve connected to the vacuum pump. Again, spectra
were taken at slowly decreasing pressures until the initial value
was attained. All measurements were made at room temperature (∼20
°C).
Optical Transmission
The zeroth-order optical transmission
was measured as a function of angle of incidence, θin. For the measurement, we used the collimated beam from a halogen
lamp with a beam diameter of ca. 0.5 mm. The sample was mounted on
a computer-controlled rotation stage. The absolute zeroth-order (ballistic)
transmission as a function of wavelength λ and θin, T(λ,θin), was obtained
by normalizing the transmission of the incident light through the
sample to that of the glass substrate. The incident light was polarized
along the x-axis (p-polarization), and θin was varied in the zx-plane to put momentum
into the x direction (see Figure a for the coordinate axes). Separately, optical
transmittance at θin = 0° was measured using
a UV–visible–near-infrared (UV–Vis–NIR)
spectrophotometer (V770, Jasco).
Figure 1
Structural characterization of the MPS
layer-on-plasmonic array
system. (a) SEM image of the square array of Al nanocylinders (diameter
200 nm, height 200 nm, array periodicity 400 × 400 nm2). The silica glass substrate is flat, and the horizontal bright
and dark lines are due to the charge buildup of the insulating glass
substrate. The inset is the photograph of the 6 mm × 6 mm sized
array fabricated on the glass. The x, y, and z coordinate axes are also shown. (b) Top-view
SEM image of the MPS layer. The thickness of the MPS layer was evaluated
by a stylus profiler (KLA Tencor) to be ca. 700 nm. (c) XRD pattern
for the MPS layer. XRD peaks come from the hexagonal pack of cylindrical
pores lying parallel to the substrate. The inset to (c) is a sketch
of the cross-sectional planes of the MPS with the hexagonal vectors
used to assign the diffraction peaks. The interplanar distance is
calculated to be d100 = 7.1 nm. (d) Sketch
of the specular reflectance measurement as a function of IPA vapor
pressure.
Structural characterization of the MPS
layer-on-plasmonic array
system. (a) SEM image of the square array of Al nanocylinders (diameter
200 nm, height 200 nm, array periodicity 400 × 400 nm2). The silica glass substrate is flat, and the horizontal bright
and dark lines are due to the charge buildup of the insulating glass
substrate. The inset is the photograph of the 6 mm × 6 mm sized
array fabricated on the glass. The x, y, and z coordinate axes are also shown. (b) Top-view
SEM image of the MPS layer. The thickness of the MPS layer was evaluated
by a stylus profiler (KLA Tencor) to be ca. 700 nm. (c) XRD pattern
for the MPS layer. XRD peaks come from the hexagonal pack of cylindrical
pores lying parallel to the substrate. The inset to (c) is a sketch
of the cross-sectional planes of the MPS with the hexagonal vectors
used to assign the diffraction peaks. The interplanar distance is
calculated to be d100 = 7.1 nm. (d) Sketch
of the specular reflectance measurement as a function of IPA vapor
pressure.
Numerical Simulation
The reflectance for the reference
MPS layer was calculated by using an analytical code based on the
transfer matrix method (TMM). The reflectance and light energy distribution
were simulated using the finite-differential time-domain (FDTD) method
(Lumerical). The coordinate axes were set according to the experiment.
Two models were used to simulate the MPS layer on the flat glass and
the MPS layer-on-plasmonic array. From the bottom upward, the following
layers were used for the MPS layer on the flat glass: silica substrate
(refractive index nsub = 1.46), the MPS
layer (dfilm = 665 nm, n was from the TMM fit), and vacuum on the top (nvac = 1.00). For the MPS layer-on-plasmonic array, we
used: silica substrate, the Al truncated cone (diameter = 200 nm, z span = 200 nm, full height = 600 nm, nAl was obtained from ref (38)), the MPS layer (dfilm = 730 nm, n from the TMM fit), and vacuum on the
top. A plane wave with the electric field oscillating in the x direction was incident on the top to simulate the transmittance
and the spatial distribution of the light energy in the samples. Notice
that both TMM and FDTD give the same result for the MPS layer on the
flat glass.
Results and Discussion
Structural Characterization
Figure a shows
a top-view SEM image of the Al nanocylinder
array. Al nanocylinders with diameter 200 nm are arranged in square
pattern with a periodicity of 400 nm. The array exhibits structural
color because of light diffraction. Figure b is a top-view SEM image of the MPS layer.
The cylindrical pores are arranged parallel to the surface of the
layer with a local alignment. There are additional meso- and micropores
that interconnect the cylindrical pores, and thus the film is accessible
from the top surface.[31]Figure c illustrates the X-ray diffraction
(XRD) pattern measured at small incident angles for the MPS layer
on the array to identify the periodicity of the mesoporous structure.
The peaks observed at 2θ = 1.24°, 2.43°, and 3.66°
are assigned to the 100, 200, and 300 crystal planes, respectively.
The MPS we fabricated is a SBA-15 type,[39] and these peaks come from the hexagonal pack of cylindrical pores
lying parallel to the substrate. The cross section of the pores is
elliptic as sketched in the inset of Figure c
because of the anisotropic shrinkage during the heat treatment. The
pores shrink in the out-of-plane direction while in-plane shrinkage
is suppressed because of the stress from the substrate.[40] The interplanar distance is calculated to be d100 = 7.1 nm. We have measured the XRD at several
azimuthal orientations, and no difference in peak positions was found,
indicating the absence of global orientation of domains in the MPS
layer; that is, the MPS layer consists of the randomly oriented domains
in which the cylindrical pores are aligned in-plane in one direction.Figure d shows
the optical setup of the specular reflectance porosimetry measurement.
The sample is placed in the chamber under controlled pressure of IPA.
The white light impinges on the sample at normal incidence, and the
reflected light is analyzed by using Fourier transform spectroscopy
(see the Experimental Section for details).
Optical Characterization
To understand the modes excitable
in the MPS layer-on-plasmonic array system, optical transmission is
examined as a function of angle of incidence θin,
as shown in Figure . The transmission shows a broad dip at the wavelength λ ∼
600 nm, which relates to the excitation of LSPRs of Al nanocylinders.
The angular profile of the dip is modulated by several dispersive
lines. The dotted lines in the figure are the in-plane diffraction
conditions, which are termed Rayleigh anomalies and satisfy the following
relation for a square lattice;[41]k02 = [k|| + m1(2π/a)]2 + m22(2π/a)2, where k0 = 2πnsur/λ and k|| = (2π/λ) sin θin are the wave vectors
of the scattered light and the incident light, respectively, nsur is the refractive index of the surrounding
medium, a is the periodicity of the array, and m1 and m2 are the
diffraction order in the x and y directions, respectively. Modulation of LSPRs along the diffraction
indicates the simultaneous excitation of LSPRs and in-plane diffraction.
It is noted some dispersive features do not follow the diffraction
lines. These features come from quasi-guided modes, where the MPS
layer acts as a waveguide. Figure b shows the transmission at θin =
0°. The main transmittance dip around λ = 600 nm is the
signature of a LSPR split by the in-plane diffraction indicated by
the dotted vertical line, and the small dips at shorter wavelengths
can be associated with the quasi-guided modes. We focus on these modes
in the specular reflectance porosimetry analysis.
Figure 2
Optical characterization
of the MPS layer-on-plasmonic array system
measured under atmospheric condition. Transmittance spectra (p-pol)
as a function of incident angle. The incidence plane is defined in
the zx-plane. The zeroth-order transmitted light
was collected by a detector (USB4000, Ocean Optics). Rayleigh anomaly
conditions are denoted as dotted lines. Unassigned dispersive features
are ascribed to quasi-guided modes. (b) A cut of experimental ballistic
transmittance spectrum in (a) at the normal incidence. The vertical
line indicates the in-plane diffraction condition.
Optical characterization
of the MPS layer-on-plasmonic array system
measured under atmospheric condition. Transmittance spectra (p-pol)
as a function of incident angle. The incidence plane is defined in
the zx-plane. The zeroth-order transmitted light
was collected by a detector (USB4000, Ocean Optics). Rayleigh anomaly
conditions are denoted as dotted lines. Unassigned dispersive features
are ascribed to quasi-guided modes. (b) A cut of experimental ballistic
transmittance spectrum in (a) at the normal incidence. The vertical
line indicates the in-plane diffraction condition.
Response of the MPS Layer on the Flat Substrate to IPA
Figure summarizes
the specular reflectance characterization of the MPS layer on the
flat silica glass substrate without the array. Figures a–c show the specular reflectance
spectra as a function of IPA pressure, represented as IPA pressure P normalized to the saturation vapor pressure of IPA, Ps (= 4.3 × 103 Pa at 20 °C).
Spectra show a Fresnel-like fringe pattern due to coherent interference
between the reflected light at the interfaces. With the increase in
relative pressure in the chamber, gas molecules adsorb onto the pore
walls. Eventually, capillary condensation within the pores takes place.
Both phenomena lead to an increment in the effective refractive index
of the MPS layer, red-shifting the fringes. At a certain relative
pressure around P/Ps ∼
0.85, a notable jump in spectral position is observed. Such an increase
corresponds to the condensation of IPA inside the pores. In the desorption
experiment, the evaporation of IPA from the pores takes place at a
lower relative pressure (P/Ps ∼ 0.75) than the condensation in the adsorption experiments.
This hysteresis appears when the pore has access to the external surface
only through a narrower neck, as the cylindrical pores in this study.[36] The hysteresis is also observed in the N2 adsorption measurement that is the standard technique of
pore-size-distribution analysis.[42−45] Spectra do not return to the
original position even after the pressure reaches the lowest value
in the desorption experiment. This means that the molecules attached
to the micropores cannot detach. In turn, after a heat treatment at
200 °C for 1 h, molecules are eventually detached, and the spectra
return to the original position. Figure c shows cuts in two-dimensional maps of Figure a at P/Ps = 0.001 and 1.0. The spectrum at P/Ps = 0.001 shows two broad
peaks at λ = 525 and 814 nm. These peaks red-shift when P/Ps = 1.0 to λ = 624
and 942 nm, respectively, and the shifts are as large as 128 nm (0.207
eV) for the longer wavelength mode. It is noted that the reflectance
is very low, i.e., ∼0.04. Because the MPS layer has the intermediate
index of refraction between the air and the glass substrate, it reduces
the optical impedance mismatch between them. We simulate the pressure-variant
specular reflectance by using an in-house analytical code based on
the transfer matrix method. We consider the MPS layer as an effective
medium with homogeneous refractive index neff and successfully reproduce the pressure-variant specular reflectance
as seen in Figures d,e using the dispersive neff as a fitting
parameter (the value of neff is shown
in Figure S1). Figure f displays the spectra at P/Ps = 0.001 and 1.0 in the adsorption
process. Nearly quantitative agreement is obtained with the experimental
reflectance in Figure c. Pressure- and wavelength-dependent neff of the effective medium is further used to simulate the MPS layer-on-plasmonic
array system, as it will be shown in the next section.
Figure 3
Characterization of the
reference MPS layer without nanocylinder
array. (a) Experimental specular reflectance spectra with varied IPA
pressure for (a) adsorption and (b) desorption processes. (c) Experimental
specular reflectance spectra at the initial (relative IPA pressure
= 0.001, represented as gray area) and the highest pressure (relative
pressure = 1.0, maroon line) states. Simulated spectra for (d) adsorption
and (e) desorption processes. (f) Simulated specular reflectance spectra
at the initial (relative pressure = 0.001) and the highest pressure
(relative pressure = 1.0) states in the adsorption process.
Characterization of the
reference MPS layer without nanocylinder
array. (a) Experimental specular reflectance spectra with varied IPA
pressure for (a) adsorption and (b) desorption processes. (c) Experimental
specular reflectance spectra at the initial (relative IPA pressure
= 0.001, represented as gray area) and the highest pressure (relative
pressure = 1.0, maroon line) states. Simulated spectra for (d) adsorption
and (e) desorption processes. (f) Simulated specular reflectance spectra
at the initial (relative pressure = 0.001) and the highest pressure
(relative pressure = 1.0) states in the adsorption process.We analyze the pore size distribution based on
the Brunauer–Emmett–Teller
(BET) equation following a protocol in ref[32] (see Figure S2 for
details). The mean pore radii are 7.8 and 5.2 nm from adsorption and
desorption curves, respectively. The pore sizes estimated from the
BET equation are on the same order but larger than that from SEM (Figure b) and XRD (Figure c). This is because
of the discrepancy in pore shape between the sample and the model.
We analyze the data using the spherical pore model with a single curvature
for the sake of simplicity. However, the MPS layer consists of cylindrical
pores with elliptic cross section where the curvature in one dimension
is zero. The discrepancy may lead to overestimation of the effective
pore size.
Response of the MPS Layer-on-Plasmonic Array
System to IPA
Figure shows the
experimental specular reflectance spectra for the MPS layer-on-plasmonic
array system as a function of P/Ps. The spectral features red-shift as P/Ps increases. It is noticed that the
jump in the shift occurs at P/Ps ∼ 0.85 and 0.75 in the adsorption and desorption,
respectively, corresponding to the condensation of the IPA molecules
in the pores. These relative pressures are the same as that for the
reference MPS layer, meaning that the pore characteristics of the
layers on the array and on the flat substrate are identical to each
other. Figure c shows
the cuts in two-dimensional maps of Figure a at P/Ps = 0.002 and 1.0. The shift in the peaks is noticeable.
Here we pick three reflectance peaks from different origins, indicated
by arrows, and compare the shifts, as summarized in Table . It can be noticed that the
Fresnel mode (λ = 746 nm at P/Ps = 0.002) features the largest shift value in terms of
wavelength, whereas it is the quasi-guided mode (λ = 505 nm
at P/Ps = 0.002) in terms
of energy shift. The LSPR (λ = 601 nm at P/Ps = 0.002) shows the smallest shift. This different
sensitivity is discussed in the next section.
Figure 4
Experimental specular
reflectance spectra for the MPS layer-on-plasmonic
array system with varied IPA pressure: (a) adsorption and (b) desorption
processes. (c) Specular reflectance spectra at the initial (relative
pressure = 0.002, represented as gray area) and the highest pressure
(relative pressure = 1.0, maroon line) states. The arrows indicate
the spectral peak positions focused in this study.
Table 1
Comparison of the Spectral Positions
of Reflectance Peaks at P/Ps = 0.002 and 1.0 and the Shift Valuesa
mode
P/Ps = 0.002 (nm/eV)
P/Ps = 1.0 (nm/eV)
|Δ| (nm/eV)
quasi-guided
505/2.455
551/2.250
46/0.205
LSPR
601/2.063
618/2.006
17/0.057
Fresnel
746/1.662
827/1.499
81/0.163
The values are
extracted from
the data of adsorption (Figure ) for the MPS layer-on-plasmonic array system.
Experimental specular
reflectance spectra for the MPS layer-on-plasmonic
array system with varied IPA pressure: (a) adsorption and (b) desorption
processes. (c) Specular reflectance spectra at the initial (relative
pressure = 0.002, represented as gray area) and the highest pressure
(relative pressure = 1.0, maroon line) states. The arrows indicate
the spectral peak positions focused in this study.The values are
extracted from
the data of adsorption (Figure ) for the MPS layer-on-plasmonic array system.The condensation allows for the
detection of low vapor pressure
of IPA. The spectral shift at P/Ps < 1.0, where Ps = 4.3
× 103 Pa at 20 °C, indicates that IPA vapor with
a concentration <2 μmol cm–3 can be detected
under atmospheric conditions. The detection limit is further reduced
as low as 20 nmol cm–3 considering the reflectance
change occurs at P/Ps < 0.01. This value is smaller than the other vapor-sensing systems[15,26] and is achieved because the mesopores in MPS layers are small enough
to condensate IPA vapor at low pressures.
Mode Extension and the
Sensitivity
Figure shows the simulated reflectance
as a function of P/Ps. Here we calculate the spectra using neff deduced from the simulation for the reference (see Figure S1). Comparison between Figures a–c and 5a–c
shows that the agreement between the experiment and the simulation
is good. This confirms that the adsorption–desorption properties
of the MPS layer-on-plasmonic array are the same as those on the flat
substrate. A slight difference appears in experimental and simulated
reflectance spectra in Figures c and 5c where the simulation shows
a splitting of LSPR. This comes from the difference that in experiment
illumination and collection are through the objective lens (numerical
aperture = 0.1) while the simulation is for normal incidence.
Figure 5
Simulated specular
reflectance spectra for the MPS layer on the
array of Al nanocylinders as a function of IPA relative pressure:
(a) adsorption and (b) desorption processes. The effective refractive
index values of the MPS layer are extracted from the fit to the specular
reflectance for the reference layer without the array (Figure S1). The circles denote the calculation
conditions of spatial energy distribution in (d–f). (c) Simulated
specular reflectance spectra at the initial (relative pressure = 0.002,
represented as gray area) and the highest pressure (relative pressure
= 1.0, maroon line) states in the adsorption process. (d–g)
Calculated spatial distributions of the squared magnitude of the electric
field normalized to the incident field, |E|2/|E0|2, in the zx-plane, at a y position intersecting the middle
of a nanocylinder (relative pressure = 0.002). Dashed lines represent
the boundaries of the materials. The wavelength of the incident light
(polarized along x-axis) is λ = (d) 461, (e)
598, and (f) 755 nm. Calculated spatial distribution of light energy
for the reference MPS layer upon irradiation with λ = 887 nm
plane wave is plotted in (g).
Simulated specular
reflectance spectra for the MPS layer on the
array of Al nanocylinders as a function of IPA relative pressure:
(a) adsorption and (b) desorption processes. The effective refractive
index values of the MPS layer are extracted from the fit to the specular
reflectance for the reference layer without the array (Figure S1). The circles denote the calculation
conditions of spatial energy distribution in (d–f). (c) Simulated
specular reflectance spectra at the initial (relative pressure = 0.002,
represented as gray area) and the highest pressure (relative pressure
= 1.0, maroon line) states in the adsorption process. (d–g)
Calculated spatial distributions of the squared magnitude of the electric
field normalized to the incident field, |E|2/|E0|2, in the zx-plane, at a y position intersecting the middle
of a nanocylinder (relative pressure = 0.002). Dashed lines represent
the boundaries of the materials. The wavelength of the incident light
(polarized along x-axis) is λ = (d) 461, (e)
598, and (f) 755 nm. Calculated spatial distribution of light energy
for the reference MPS layer upon irradiation with λ = 887 nm
plane wave is plotted in (g).To understand the difference in the spectral shift of the reflectance
peaks, we simulate the light energy distributions inside the system
upon irradiation with plane lightwaves at three typical wavelengths
for P/Ps = 0.002. For
the quasi-guided mode at λ = 461 nm (Figure d), the light energy is distributed in both
inside the MPS layer and in the vicinity of the Al nanocylinder, reflecting
the hybrid nature of the mode between the LSPR and the waveguide.
For the LSPR at λ = 598 nm (Figure e), the energy localized in the vicinity
of the nanocylinder is the largest among the three wavelengths, resulting
in the largest reflectance intensity among them. Even for the Fresnel
mode at λ = 755 nm (Figure f), the light energy is not only distributed to the
MPS layer but also confined around the nanocylinder. This increases
the reflectance intensity compared to the Fresnel modes that appear
for the MPS layer on the flat substrate, where the highest reflectance
is only ∼0.04.Because the relative IPA pressure changes
the effective refractive
index of the MPS layer, the large distribution of the light energy
in the layer results in the large shift of the peak; that is, the
modes with the light energy extended into the layer are more sensitive
compared to the modes localized in the nanocylinder. This explains
the smallest shift for the LSPR mode among the three. The Fresnel
modes that are observed for the MPS layer on the flat substrate in Figure c show the shift
larger than any of the modes in the layer on the array because it
is extended in the layer. However, the intensity of the peak is very
low because of the small refractive index mismatch at the interface.
The simulation (Figure g) confirms the extended but notably small light energy distribution
in the layer. The reflectance of MPS layer-on-plasmonic array system
is larger because of the partial hybridization with LSPRs even for
the Fresnel mode as shown in the spatial field distribution.The benefit of the MPS layer-on-plasmonic array system is emphasized
by the comparison to the “MPS layer-on-mirror” system
where the MPS layer is on a metallic film. Our simulations show a
similar optical behavior when comparing the reflectance spectrum of
the porous layer deposited over a glass substrate or a metallic film.
Indeed, the width and depth of Fresnel-type reflectance fringes along
with the spectral shift of these modes with the refractive index change
are on the same order regardless of the substrate they are deposited
(see Figure S3). Only absolute reflectance
values are larger when the porous layer is deposited over the Al film,
which acts as a mirror. In contrast, the plasmonic array provides
similar values of the spectral shift with the refractive index but
significantly larger reflectance contrast. Consequently, the MPS layer-on-plasmonic
array system shows large reflection contrast and an acute optical
response to chemicals that is visible to the eyes (see Figure S4), which are beneficial for application
as optical environmental sensors.
Conclusions
We
made a plasmonic system that responds to the relative pressure
of IPA. This was achieved by covering the array of Al nanocylinders
with a slab waveguide layer of MPS in which the mesosized pores act
as catcher and condenser of the IPA molecules. We characterized the
response by using specular porosimetry, where the reflectance peaks
shifted with the relative pressure of IPA. The shift depends on the
mode extension in the MPS layer, while the intensity of the reflectance
peak depends mainly on the strength of the interaction between incident
lightwave with the LSPRs. The combination of the MPS layer with the
Al nanocylinder array achieves both extension of the mode inside the
layer and the strong interaction, which are useful for optical sensors.
Authors: Olalla Sánchez-Sobrado; Gabriel Lozano; Mauricio E Calvo; Ana Sánchez-Iglesias; Luis M Liz-Marzán; Hernán Míguez Journal: Adv Mater Date: 2011-03-11 Impact factor: 30.849
Authors: Matthias Thommes; Bernd Smarsly; Matthijs Groenewolt; Peter I Ravikovitch; Alexander V Neimark Journal: Langmuir Date: 2006-01-17 Impact factor: 3.882