Literature DB >> 32192333

Back-End, CMOS-Compatible Ferroelectric Field-Effect Transistor for Synaptic Weights.

Mattia Halter1,2, Laura Bégon-Lours1, Valeria Bragaglia1, Marilyne Sousa1, Bert Jan Offrein1, Stefan Abel1, Mathieu Luisier2, Jean Fompeyrine1.   

Abstract

Neuromorphic computing architectures enable the dense colocation of memory and processing elements within a single circuit. This colocation removes the communication bottleneck of transferring data between separate memory and computing units as in standard von Neuman architectures for data-critical applications including machine learning. The essential building blocks of neuromorphic systems are nonvolatile synaptic elements such as memristors. Key memristor properties include a suitable nonvolatile resistance range, continuous linear resistance modulation, and symmetric switching. In this work, we demonstrate voltage-controlled, symmetric and analog potentiation and depression of a ferroelectric Hf0.57Zr0.43O2 (HZO) field-effect transistor (FeFET) with good linearity. Our FeFET operates with low writing energy (fJ) and fast programming time (40 ns). Retention measurements have been performed over 4 bit depth with low noise (1%) in the tungsten oxide (WOx) readout channel. By adjusting the channel thickness from 15 to 8 nm, the on/off ratio of the FeFET can be engineered from 1 to 200% with an on-resistance ideally >100 kΩ, depending on the channel geometry. The device concept is using earth-abundant materials and is compatible with a back end of line (BEOL) integration into complementary metal-oxide-semiconductor (CMOS) processes. It has therefore a great potential for the fabrication of high-density, large-scale integrated arrays of artificial analog synapses.

Entities:  

Keywords:  BEOL; ferroelectric field-effect transistor; ferroelectric switching; hafnium zirconium oxide; memristor; tungsten oxide

Year:  2020        PMID: 32192333     DOI: 10.1021/acsami.0c00877

Source DB:  PubMed          Journal:  ACS Appl Mater Interfaces        ISSN: 1944-8244            Impact factor:   9.229


  1 in total

Review 1.  Advances of RRAM Devices: Resistive Switching Mechanisms, Materials and Bionic Synaptic Application.

Authors:  Zongjie Shen; Chun Zhao; Yanfei Qi; Wangying Xu; Yina Liu; Ivona Z Mitrovic; Li Yang; Cezhou Zhao
Journal:  Nanomaterials (Basel)       Date:  2020-07-23       Impact factor: 5.076

  1 in total

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