Literature DB >> 32189763

Reflection Correction for High-Accuracy Transmittance Measurements on Filter Glasses.

K D Mielenz1, R Mavrodineanu1.   

Abstract

Multiple reflections in the sample compartment of a spectrophotometer constitute a source of systematic bias in transmittance measurements on filter glasses. This bias may be removed by applying a numerical correction obtained from measurements on tilted samples in polarized light. For a high-accuracy spectrophotometer, this correction was found to be of the order of several 10-4 transmittance units, independent of polarization, but slightly wavelength dependent.

Keywords:  Correction for reflections; correction; high accuracy; reflections, multiple; spectrophotometry; systematic bias in spectrophotometry; transmittance

Year:  1973        PMID: 32189763      PMCID: PMC6728497          DOI: 10.6028/jres.077A.041

Source DB:  PubMed          Journal:  J Res Natl Bur Stand A Phys Chem        ISSN: 0022-4332


  2 in total

1.  Transmission measurements with the Beckman quartz spectrophotometer.

Authors:  K S GIBSON; M M BALCOM
Journal:  J Res Natl Bur Stand (1934)       Date:  1947-06

2.  New reference spectrophotometer.

Authors:  K D Mielenz; K L Eckerle; R P Madden; J Reader
Journal:  Appl Opt       Date:  1973-07-01       Impact factor: 1.980

  2 in total

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