| Literature DB >> 32176401 |
Gi Woong Shim1, Woonggi Hong1, Jun-Hwe Cha1, Jung Hwan Park2, Keon Jae Lee3, Sung-Yool Choi1.
Abstract
As the need for super-high-resolution displays with various form factors has increased, it has become necessary to produce high-performance thin-film transistors (TFTs) that enable faster switching and higher current driving of each pixel in the display. Over the past few decades, hydrogenated amorphous silicon (a-Si:H) has been widely utilized as a TFT channel material. More recently, to meet the requirement of new types of displays such as organic light-emitting diode displays, and also to overcome the performance and reliability issues of a-Si:H, low-temperature polycrystalline silicon and amorphous oxide semiconductors have partly replaced a-Si:H channel materials. Basic material properties and device structures of TFTs in commercial displays are explored, and then the potential of atomically thin layered transition metal dichalcogenides as next-generation channel materials is discussed.Entities:
Keywords: contact resistance; device structures; display technologies; thin film transistors; transition metal dichalcogenides
Year: 2020 PMID: 32176401 DOI: 10.1002/adma.201907166
Source DB: PubMed Journal: Adv Mater ISSN: 0935-9648 Impact factor: 30.849