Curt A Richter1, Emily G Bittle1. 1. Nanoscale Device Characterization Division of the Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland USA.
Authors: D J Gundlach; J E Royer; S K Park; S Subramanian; O D Jurchescu; B H Hamadani; A J Moad; R J Kline; L C Teague; O Kirillov; C A Richter; J G Kushmerick; L J Richter; S R Parkin; T N Jackson; J E Anthony Journal: Nat Mater Date: 2008-02-17 Impact factor: 43.841