| Literature DB >> 32161297 |
Yang Yang1,2, Yinghui Guo1,2, Yijia Huang1,2, Mingbo Pu1,2, Yanqin Wang1,2, Xiaoliang Ma1,2, Xiong Li1,2, Xiangang Luo3,4.
Abstract
Suppression of the crosstalk between adjacent waveguides is important yet challenging in the development of compact and dense photonic integrated circuits (PICs). During the past few years, a few of excellent approaches have been proposed to achieve this goal. Here, we propose a novel strategy by introducing nonuniform subwavelength strips between adjacent waveguides. In order to determine the widths and positions of nonuniform subwavelength strips, the particle swarm optimization (PSO) algorithm is utilized. Numerical results demonstrate that the coupling length between adjacent waveguides is increased by three (five) orders of magnitude in comparison with the case of uniform (no) subwavelength strips. Our method greatly reduces crosstalk and is expected to achieve a highly compact integrated density of PICs.Entities:
Year: 2020 PMID: 32161297 PMCID: PMC7066159 DOI: 10.1038/s41598-020-61149-1
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Simulation model and mode field distribution. (a) The proposed configuration that comprises a nonuniform silicon strip array inserted between the silicon waveguide pair. The substrate and cladding are silica and air, respectively. The width and height of two identical silicon ridge waveguides are 500 nm and 220 nm, respectively. (b) An enlarged view of the structure. The widths of three strips are w, w, w3, respectively. The widths of four gaps are g1, g2, g3, g4 respectively. (c) The electric field distribution of the waveguide cross section is plotted in log scale.
Figure 2The flow chart of scripted MODE solutions with matlab.
Figure 3Optimization process and results. Effect of the strip width on the coupling length for uniform configurations with (a) one strip, (b) two strips and (c) three strips. (d) The iterative result obtained by using PSO algorithm with three nonuniform strips.
Figure 4The electric field intensity distribution versus y and L. (a) Electric field intensity distribution with a propagation length of 10 m. No coupling occurs between two waveguides. (b) Electric field intensity distribution with a propagation length of 100 m, where coupling is going to happen. (c) Electric field intensity distribution with a propagation length of 500 m. It could be seen that a complete coupling process is generated between two waveguides. (d) Electric field intensity distribution with propagation length of 2000 m.
Figure 5Simulation results of evanescent coupling waveguides with a separation gap of 450 nm. (a) Schematic diagram of structure with a separation gap of 450 nm. (b) Mode intensity distribution in waveguide cross section. (c,d) Distribution of light fields with different propagation lengths. (e) The optimization progress for evanescent coupling waveguide with a separation gap of 450 nm.