| Literature DB >> 32153294 |
Marion Louvel1, James W E Drewitt1, Allan Ross2, Richard Thwaites2, Benedict J Heinen1, Dean S Keeble2, Christine M Beavers2, Michael J Walter3, Simone Anzellini2.
Abstract
A new diamond-anvil cell apparatus for in situ synchrotron X-ray diffraction measurements of liquids and glasses, at pressures from ambient to 5 GPa and temperatures from ambient to 1300 K, is reported. This portable setup enables in situ monitoring of the melting of complex compounds and the determination of the structure and properties of melts under moderately high pressure and high temperature conditions relevant to industrial processes and magmatic processes in the Earth's crust and shallow mantle. The device was constructed according to a modified Bassett-type hydrothermal diamond-anvil cell design with a large angular opening (θ = 95°). This paper reports the successful application of this device to record in situ synchrotron X-ray diffraction of liquid Ga and synthetic PbSiO3 glass to 1100 K and 3 GPa. open access.Entities:
Keywords: diamond-anvil cells; extreme conditions; glasses and melts; metallic liquids; resistive heating; synchrotron characterization
Year: 2020 PMID: 32153294 PMCID: PMC7064104 DOI: 10.1107/S1600577519016801
Source DB: PubMed Journal: J Synchrotron Radiat ISSN: 0909-0495 Impact factor: 2.616
Figure 1CAD-drawing of the new HXD95 cell: (a) lateral section and (b) exploded figure. The heaters (not drawn) are constructed from 250 µm-diameter Mo wire wound around the WC seats. (c) Top and (d) side view of the CAD-drawing of the specially perforated Almax–Boehler diamond anvil used during the experiments on the downstream side of the cell. The units in (d) are degrees and millimetres.
Figure 2(a) Schematic of the I15 beamline at DLS. Photographs of the HXD95 DAC showing (b) the hand-made heaters and connections for the power supplies and thermocouples and (c) the final setup in position on the sample stage of the XRD station at beamline I15 at DLS.
Figure 3Comparison between the (a) measured XRD intensities, (b) corresponding partial structure factor S GaGa(Q) and (c) partial PDF g GaGa(r) for liquid Ga at ∼0.1 GPa in the new HXD95 device (black curve) and the externally heated cell (RH-DAC) available on I15 (Drewitt et al., 2018 ▸) (red curve). For clarity, the HXD95 measurement has been displaced vertically.
Figure 4The diffraction patterns for PbSiO3 glass measured in the HXD95 showing the glass compressed to 2.5 GPa at ambient T, crystallization at 873 K, and the fully molten liquid at 1100 K (solid black curves). The broad peaks in the raw pattern at 873 K for Q > 8 Å arise from the diamond anvils. The red dashed curve is the empty cell background measurement. For clarity, the results are displaced vertically.
Figure 5(a) The total structure factors S(Q) for PbSiO3 glass and liquid at 2.5 GPa and 300 to 1100 K (solid black curves). The dashed red curves are ambient-P measurements of PbSiO3 glass made at beamline ID11 at the ESRF. The inset shows comparison between the 300 K measurement at 2.5 GPa and the ambient-P glass in the low-Q region. (b) The total PDFs G(r) obtained from the corresponding S(Q) functions in (a) by Fourier transformation. For clarity, the results are displaced vertically.