| Literature DB >> 32126649 |
Chae Soo Kim1, Taehyung Kim1, Kyung Kyu Min1, Sungjun Kim2, Byung-Gook Park1.
Abstract
In this paper, we pose reverse leakage current issue which occurs when resistive random access memory (RRAM) is used as synapse for spiking neural networks (SNNs). To prevent this problem, 1 diode-1 RRAM (1D1R) synapse is suggested and simulated to examine their current rectifying chracteristics, Furthermore, high density of 1 K 3D 1D1R synapse array structure and its process flow are proposed.Mesh:
Year: 2020 PMID: 32126649 DOI: 10.1166/jnn.2020.17806
Source DB: PubMed Journal: J Nanosci Nanotechnol ISSN: 1533-4880