| Literature DB >> 32095710 |
François Royer1, Bobin Varghese1, Emilie Gamet1, Sophie Neveu2, Yves Jourlin1, Damien Jamon1.
Abstract
We report on the design, fabrication, and characterization of an all-dielectric one-dimensional (1D) resonant device formed by a silicon nitride grating impregnated by a low-index magneto-optical silica-type matrix. This impregnation is realized through the dipping of the 966 nm periodic template in a sol-gel solution previously doped with CoFe2O4 nanoparticles, and able to fill the grating slits. By a proper adjustment of the geometrical parameters of such a photonic crystal membrane, simultaneous excitation of transverse electric (TE) and transverse magnetic (TM) polarization resonances is nearly achieved at 1570 nm. This TE/TM phase-matching situation leads to a fivefold enhancement of the Faraday effect in the resonance area with an increased merit factor of 0.32°. Moreover, the device demonstrates its ability to enhance longitudinal and transverse Kerr effects for the other directions of the applied magnetic field. Taking benefits from the ability of the nanocomposite material to be processed on photonic platforms, and despite its quite low magneto-optical activity compared to classical magnetic materials, this work proves that an all-dielectric 1D device can produce a high magneto-optical sensitivity to every magnetic field directions.Entities:
Year: 2020 PMID: 32095710 PMCID: PMC7033961 DOI: 10.1021/acsomega.9b03728
Source DB: PubMed Journal: ACS Omega ISSN: 2470-1343
Figure 1(a) Schematic of the device under consideration with optical/geometrical parameters. (b) Magnetic field directions used for measurements and RCWA calculations. (c) Transmittance of the device measured and calculated at normal incidence. (d) Color map of the device transmittance calculated under TM and TE polarized illuminations as a function of the wavelength and incident angle. Incident angle axis has been reversed for TM to highlight the TE/TM resonance overlap at normal incidence.
Figure 2(a–c) Measurements. (d–f) RCWA numerical calculations. Normal incidence Faraday rotation spectrum plotted with transmittance for each polarization, and related figure of merit (FOM). The reference sample is a MO film with a thickness of 593 nm.
Comparison of the Figure of Merit (FOM) of Several Devices Employed to Enhance the Faraday rotationa
| FOM (deg) | ε12 | MO material | device features | λ (nm) | refs |
|---|---|---|---|---|---|
| 5.8 (5T) | 0.074 | EuS at 20 K | 1D-plasmonic | 750 | ( |
| 0.48 | 0.016 | BIG | 1D-plasmonic | 963 | ( |
| 0.32 | 0.0037 | CoFe2O4 as NP | 1D-dielectric | 1570 | this work |
| ∼5 | 0.01 | 700 | ( | ||
| 7.35 | 0.06 | 1393 | ( | ||
| 0.75 | 0.01 | 807 | ( | ||
| 0.48 | 0.01 | 963 | ( | ||
| 0.01 | 0.6 | 710 | ( |
Three first lines relate to experimental realizations whereas the three others (italic) relate to numerical simulations only.
Figure 3(a–c) Measurements. (d–f) RCWA numerical calculations. (a, d) Faraday ellipticity (FE) spectrum plotted with transmittance at the normal incidence for TE polarization. (b, e) Longitudinal Kerr rotation (KR) measured in transmittance configuration for several angles and TM polarization. (d–f) Transverse Kerr effect in transmission and reflection configurations, with TM polarization (incident angle: 2.6°).