| Literature DB >> 32042164 |
Sang-Hoon Bae1,2, Kuangye Lu1,2, Yimo Han3, Sungkyu Kim1,2, Kuan Qiao1,2, Chanyeol Choi2,4, Yifan Nie5, Hyunseok Kim1,2, Hyun S Kum1,2, Peng Chen1,2, Wei Kong1,2, Beom-Seok Kang1,2, Chansoo Kim1,2, Jaeyong Lee1,2, Yongmin Baek6, Jaewoo Shim1,2, Jinhee Park7, Minho Joo7, David A Muller3,8, Kyusang Lee9, Jeehwan Kim10,11,12.
Abstract
Although conventional homoepitaxy forms high-quality epitaxial layers1-5, the limited set of material systems for commercially available wafers restricts the range of materials that can be grown homoepitaxially. At the same time, conventional heteroepitaxy of lattice-mismatched systems produces dislocations above a critical strain energy to release the accumulated strain energy as the film thickness increases. The formation of dislocations, which severely degrade electronic/photonic device performances6-8, is fundamentally unavoidable in highly lattice-mismatched epitaxy9-11. Here, we introduce a unique mechanism of relaxing misfit strain in heteroepitaxial films that can enable effective lattice engineering. We have observed that heteroepitaxy on graphene-coated substrates allows for spontaneous relaxation of misfit strain owing to the slippery graphene surface while achieving single-crystalline films by reading the atomic potential from the substrate. This spontaneous relaxation technique could transform the monolithic integration of largely lattice-mismatched systems by covering a wide range of the misfit spectrum to enhance and broaden the functionality of semiconductor devices for advanced electronics and photonics.Entities:
Year: 2020 PMID: 32042164 DOI: 10.1038/s41565-020-0633-5
Source DB: PubMed Journal: Nat Nanotechnol ISSN: 1748-3387 Impact factor: 39.213