Literature DB >> 32041348

Automatic Fabric Defect Detection Using Cascaded Mixed Feature Pyramid with Guided Localization.

You Wu1, Xiaodong Zhang1, And Fengzhou Fang1.   

Abstract

Generic object detection algorithms for natural images have been proven to have excellent performance. In this paper, fabric defect detection on optical image datasets is systematically studied. In contrast to generic datasets, defect images are multi-scale, noise-filled, and blurred. Back-light intensity would also be sensitive for visual perception. Large-scale fabric defect datasets are collected, selected, and employed to fulfill the requirements of detection in industrial practice in order to address these imbalanced issues. An improved two-stage defect detector is constructed for achieving better generalization. Stacked feature pyramid networks are set up to aggregate cross-scale defect patterns on interpolating mixed depth-wise block in stage one. By sharing feature maps, center-ness and shape branches merges cascaded modules with deformable convolution to filter and refine the proposed guided anchors. After balanced sampling, the proposals are down-sampled by position-sensitive pooling for region of interest, in order to characterize interactions among fabric defect images in stage two. The experiments show that the end-to-end architecture improves the occluded defect performance of region-based object detectors as compared with the current detectors.

Entities:  

Keywords:  cascaded center-ness; cross-scale; deformable localization; fabric defect; mixed kernels; object detection

Year:  2020        PMID: 32041348     DOI: 10.3390/s20030871

Source DB:  PubMed          Journal:  Sensors (Basel)        ISSN: 1424-8220            Impact factor:   3.576


  2 in total

1.  Increasing the Generalization of Supervised Fabric Anomaly Detection Methods to Unseen Fabrics.

Authors:  Oliver Rippel; Corinna Zwinge; Dorit Merhof
Journal:  Sensors (Basel)       Date:  2022-06-23       Impact factor: 3.847

2.  RPDNet: Automatic Fabric Defect Detection Based on a Convolutional Neural Network and Repeated Pattern Analysis.

Authors:  Yubo Huang; Zhong Xiang
Journal:  Sensors (Basel)       Date:  2022-08-19       Impact factor: 3.847

  2 in total

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