| Literature DB >> 32041275 |
Na Eun Lee1, Sang Yoon Lee1, Hyung San Lim1, Sung Ho Yoo1, Sung Oh Cho1.
Abstract
Graphene quantum dots (GQDs) can be highly beneficial in various fields due to their unique properties, such as having an effective charge transfer and quantum confinement. However, defects on GQDs hinder these properties, and only a few studies have reported fabricating high-quality GQDs with high crystallinity and few impurities. In this study, we present a novel yet simple approach to synthesizing high-quality GQDs that involves annealing <span class="Chemical">silicon carbide (SiC) under low vacuum while introducing hydrogen (H) etching gas; no harmful chemicals are required in the process. The fabricated GQDs are composed of a few graphene layers and possess high crystallinity, few defects and high purity, while being free from oxygen functional groups. The edges of the GQDs are hydrogen-terminated. High-quality GQDs form on the etched SiC when the etching rates of Si and C atoms are monitored. The size of the fabricated GQDs and the surface morphology of SiC can be altered by changing the operating conditions. Collectively, a novel route to high-quality GQDs will be highly applicable in fields involving sensors and detectors.Entities:
Keywords: graphene quantum dots; high-quality; hydrogen-assisted pyrolysis; silicon carbide
Year: 2020 PMID: 32041275 PMCID: PMC7075118 DOI: 10.3390/nano10020277
Source DB: PubMed Journal: Nanomaterials (Basel) ISSN: 2079-4991 Impact factor: 5.076
Figure 1The schematic layout of the synthesis of high-quality graphene quantum dots (GQDs) by the hydrogen-assisted pyrolysis of silicon carbide (SiC).
Figure 2The field-emission scanning electron microscope (FESEM) image of (a) the pristine SiC plate and (b) the GQDs on the SiC plate after being annealed at 1500 °C on hydrogen etching gas. (c) The transmission electron microscope (TEM) image of the detached GQDs and the high-resolution transmission electron microscope (HRTEM) image of the GQDs with their lattice spacing.
Figure 3(a) The Raman spectra of the detached GQDs. (b) The atomic force microscope (AFM) image of the GQDs with the thickness graph of GQDs in yellow (the length of the yellow line inside the AFM image is 2.7 μm). (c) The X-ray photoelectron spectroscopy (XPS) high-resolution C1s spectrum and (d) the Fourier transform infrared (FT-IR) results of the GQDs.
Figure 4The HRTEM image of the GQDs fabricated on the SiC at a temperature of: (a) 1500 °C, (b) 1450 °C, (c) 1400 °C, (d) The correlation graph between the annealing temperature and the average size of the GQDs.