| Literature DB >> 31989456 |
Andreas M Brandmaier1,2, Paolo Ghisletta3,4,5, Timo von Oertzen6,7.
Abstract
Longitudinal data collection is a time-consuming and cost-intensive part of developmental research. Wu et al. (2016) discussed planned missing (PM) designs that are similar in efficiency to complete designs but require fewer observations per person. The authors reported optimal PM designs for linear latent growth curve models based on extensive Monte Carlo simulations. They called for further formal investigation of the question as to how much the proposed PM mechanisms influence study design efficiency to arrive at a better understanding of PM designs. Here, we propose an approximate solution to the design problem by comparing the asymptotic effective errors of PM designs. Effective error was previously used to find optimal longitudinal study designs for complete data designs; here, we extend the approach to planned missing designs. We show how effective error is a metric for comparing the efficiency of study designs with both planned and unplanned missing data, and how earlier simulation-based results for PM designs can be explained by an asymptotic solution. Our approach is computationally more efficient than Wu et al.'s approach and leads to a better understanding of how various design factors, such as the number of measurement occasions, their temporal arrangement, attrition rates, and PM design patterns interact and how they conjointly determine design efficiency. We provide R scripts to calculate effective errors in various scenarios of PM designs.Entities:
Keywords: Individual differences; Longitudinal data; Optimal design; Power analysis; Random effects; Random slope
Mesh:
Year: 2020 PMID: 31989456 PMCID: PMC7406489 DOI: 10.3758/s13428-019-01325-y
Source DB: PubMed Journal: Behav Res Methods ISSN: 1554-351X
Example of a planned missing (PM) design. Participants are randomly assigned to each pattern. Proportion of participants in each pattern are typically identical
| A three-form design | ||||
|---|---|---|---|---|
| Pattern | Test item groups | |||
| X | A | B | C | |
| 1 | 1 | 1 | 1 | 0 |
| 2 | 1 | 1 | 0 | 1 |
| 3 | 1 | 0 | 1 | 1 |
One set of items/observation is common to everybody (“X”) whereas the remaining “partial” groups are administered to subsets of participants. Whether a specific item set was observed is encoded as 1 = observed, 0 = missing
Fig. 1Latent growth curve model with five measurement occasions. The parametrization shown corresponds to the reference model considered throughout. Icept = Intercept
All possible complete designs with three out of five equidistant measurement occasions (Design), the variance of the time points (Var(t)), and their effective error for a Wald test of slope variance (EE; effective error)
| Design | Var(t) | EE | Design | Var(t) | EE |
|---|---|---|---|---|---|
| {1,2,3} | 1 | 15 | {1,4,5} | 4.33 (*) | 3.46 |
| {1,2,4} | 2.33 | 6.43 | {2,3,4} | 1 | 15 |
| {1,2,5} | 4.33 (*) | 3.46 | {2,3,5} | 2.33 | 6.43 |
| {1,3,4} | 2.33 | 6.43 | {2,4,5} | 2.33 | 6.43 |
| {1,3,5} | 4 | 3.75 | {3,4,5} | 1 | 15 |
Designs with optimal variance are denoted with an asterisk. Results are displayed in two adjacent columns
Fig. 2Harmonic (left) and arithmetic (right) mean of effective errors. Effective errors (represented as Error #1 and Error #2) combine according to the harmonic mean (left)
Top ten designs for the variance parameter of the slope in a linear growth curve model without attrition
| SEEDMC | Asymptotic approach | ||||||
|---|---|---|---|---|---|---|---|
| Rank | Design | Response pattern | RE | EE | AEE | RE | |
| 1 | C1 | 1,666 | {1,2,5} | 1.00 | 3.46 | 3.46 | 1.00 |
| 2 | C3 | 1,666 | {1,4,5} | 0.98 | 3.46 | 3.46 | 1.00 |
| 3 | M33 | 1,666 | {1,2,5 | 1,3,5 | 1,4,5} | 0.97 | 3.55 | 3.55 | 0.97 |
| 4 | C2 | 1,666 | {1,3,5} | 0.94 | 3.75 | 3.75 | 0.92 |
| 5 | C5 | 1,250 | {1,2,4,5} | 0.85 | 3.00 | 4.00 | 0.86 |
| 6 | M42 | 1,250 | {1,2,3,5 | 1,2,4,5} | 0.82 | 3.2 | 4.26 | 0.81 |
| 7 | M45 | 1,250 | {1,2,4,5 | 1,3,4,5} | 0.81 | 3.2 | 4.26 | 0.81 |
| 8 | M23 | 1,250 | {1,2,3,5 | 1,2,4,5 | 1,3,4,5} | 0.81 | 3.27 | 4.36 | 0.79 |
| 9 | C6 | 1,250 | {1,3,4,5} | 0.79 | 3.43 | 4.57 | 0.76 |
| 10 | C4 | 1,250 | {1,2,3,5} | 0.78 | 3.43 | 4.57 | 0.76 |
The order of designs corresponds to the order reported in the supplementary materials of the Wu et al. (2016) simulation #4; p. 2. Columns show the rank order (rank), design name (design), the sample size feasible under the pre-specified cost constraint (N), the pattern of observations (response pattern), efficiency relative to the best model according to the simulation by Wu et al. (2016) (RE; relative efficiency). The final three columns show the result of our approach, effective error variance (EE; effective error), adjusted effective error (AEE), and relative efficiency (RE) as the ratio of a design’s AEE and the best AEE
Effective errors for missing patterns derived from pattern C7 {1,2,3,4,5} that keep the first and last occasion of measurement
| Design | Pattern | N | Effective error | Effective SE | Relative error |
|---|---|---|---|---|---|
| C7 | {1,2,3,4,5} | 1,000 | 3 | 0.50 | 1.0 |
| C5 | {1,2,4,5} | 1,250 | 3 | 0.45 | 1.0 |
| C6 | {1,3,4,5} | 1,250 | 3.43 | 0.47 | 0.88 |
| C4 | {1,2,3,5} | 1,250 | 3.43 | 0.47 | 0.88 |
| C1 | {1,2,5} | 1,666 | 3.46 | 0.40 | 0.87 |
| C3 | {1,4,5} | 1,666 | 3.46 | 0.40 | 0.87 |
| C2 | {1,3,5} | 1,666 | 3.75 | 0.41 | 0.80 |
Columns describe the pattern name (design), the pattern of measurement occasions (pattern), sample size (N), effective error and effective standard error (effective SE), and the relative error as the ratio of effective errors
The four most efficient designs for hypotheses on the slope variance in linear latent growth curve models with low and high attrition rates
| Attrition | Rank | Design | Pattern | EE | AEE | RE | |
|---|---|---|---|---|---|---|---|
| Low | 1 | C3 | {1,4,5} | 1,666 | 4.68 | 4.68 | 1.0 |
| 2 | M33 | {1,2,5 | 1,3,5 | 1,4,5} | 1,666 | 4.87 | 4.87 | 0.96 | |
| 3 | C1 | {1,2,5} | 1,666 | 4.85 | 4.85 | 0.96 | |
| 4 | C5 | {1,2,4,5} | 1,250 | 4.04 | 5.39 | 0.87 | |
| High | 1 | C5 | {1,2,4,5} | 1,250 | 7.52 | 10.02 | 1.0 |
| 2 | M45 | {1,2,4,5 | 1,3,4,5} | 1,250 | 7.71 | 10.28 | 0.97 | |
| 3 | C6 | {1,3,4,5} | 1,250 | 7.91 | 10.55 | 0.95 | |
| 4 | M29 | {1,2,4,5 | 1,3,4,5 | 2,3,4,5} | 1,250 | 9.26 | 12.35 | 0.81 |
Columns show level of attrition rate (attrition), the rank order of the designs (rank), name of the design (design), pattern of missing data (pattern), the affordable sample size under the chosen cost constraint (N), effective error (EE), adjusted effective error (AEE), and relative efficiency based on the ratio of a model’s AEE and the optimal AEE
Top ten designs (and designs C2, C3) for the variance parameter of the intercept in a linear growth curve model without attrition
| SEEDMC | Asymptotic approach | ||||||
|---|---|---|---|---|---|---|---|
| Rank | Design | N | Response pattern | RE | EE | AEE | RE |
| 1 | C1 | 1666 | {1,2,5} | 1.0 | 19.62 | 19.62 | 1.0 |
| 2 | M30 | 1666 | {1,2,3 | 1,2,4 | 1,2,5} | 0.95 | 21.79 | 21.79 | 0.90 |
| 3 | C4 | 1250 | {1,2,3,5} | 0.89 | 18.00 | 24.00 | 0.82 |
| 4 | M42 | 1250 | {1,2,3,5 | 1,2,4,5} | 0.85 | 18.72 | 24.96 | 0.79 |
| 5 | M10 | 1666 | {1,2,3 | 1,2,4 | 1,2,5 | 1,3,4 | 1,3,5 | 1,4,5} | 0.84 | 24.17 | 24.17 | 0.81 |
| 6 | M40 | 1250 | {1,2,3,4 | 1,2,3,5} | 0.83 | 19.38 | 25.85 | 0.76 |
| 7 | M20 | 1250 | {1,2,3,4 | 1,2,3,5 | 1,2,4,5} | 0.82 | 19.42 | 25.90 | 0.76 |
| 8 | M33 | 1666 | {1,2,5 | 1,3,5 | 1,4,5} | 0.82 | 23.88 | 23.88 | 0.82 |
| 9 | C5 | 1250 | {1,2,4,5} | 0.81 | 19.50 | 26.00 | 0.75 |
| 10 | M41 | 1250 | {1,2,3,4 | 1,2,4,5} | 0.79 | 20.22 | 26.96 | 0.73 |
| 12 | C2 | 1666 | {1,3,5} | 0.79 | 25.00 | 25.00 | 0.78 |
| 29 | C3 | 1666 | {1,4,5} | 0.65 | 28.85 | 28.85 | 0.68 |
The order of designs corresponds to the order reported in the supplementary materials of Wu et al. (2016), simulation #3; p. 2. Columns show the rank order (rank), design name (design), the sample size feasible under the pre-specified cost constraint (N), the pattern of observations (response pattern), efficiency relative to the best model according to the simulation by Wu et al. (2016) (RE; relative efficiency). The last three columns show the result of our approach: effective error (EE); adjusted effective error (AEE), and relative efficiency (RE) the ratio of a design’s AEE and the best AEE.
Monte Carlo simulated effective standard errors for intercept variance listed for all complete designs with three or four measurement occasions
| Design | EE | Design | EE | Design | EE |
|---|---|---|---|---|---|
| {1,2,3} | 2.05 | {1,4,5} | 2.23 | {2,3,4,5} | 3.21 |
| {1,2,4} | 1.89 | {2,3,4} | 4.18 | {1,3,4,5} | 2.26 |
| {1,2,5} | 1.81 | {2,3,5} | 2.98 | {1,2,4,5} | 2.01 |
| {1,3,4} | 2.18 | {2,4,5} | 3.49 | {1,2,3,5} | 1.93 |
| {1,3,5} | 2.05 | {3,4,5} | 7.77 | {1,2,3,4} | 2.08 |
Columns show the design pattern (design) and their effective errors (EE). Results are displayed in three adjacent columns