| Literature DB >> 31971302 |
Taeyeong Yun1, Hyerim Kim2,3, Aamir Iqbal2,4, Yong Soo Cho2,3, Gang San Lee1, Myung-Ki Kim3, Seon Joon Kim2,5, Daesin Kim2,3, Yury Gogotsi5, Sang Ouk Kim1, Chong Min Koo2,3,4.
Abstract
Miniaturization of electronics demands electromagnetic interference (EMI) shielding of nanoscale dimension. The authors report a systematic exploration of EMI shielding behavior of 2D Ti3 C2 Tx MXene assembled films over a broad range of film thicknesses, monolayer by monolayer. Theoretical models are used to explain the shielding mechanism below skin depth, where multiple reflection becomes significant, along with the surface reflection and bulk absorption of electromagnetic radiation. While a monolayer assembled film offers ≈20% shielding of electromagnetic waves, a 24-layer film of ≈55 nm thickness demonstrates 99% shielding (20 dB), revealing an extraordinarily large absolute shielding effectiveness (3.89 × 106 dB cm2 g-1 ). This remarkable performance of nanometer-thin solution processable MXene proposes a paradigm shift in shielding of lightweight, portable, and compact next-generation electronic devices.Entities:
Keywords: 2D materials; MXene; electromagnetic interference shielding; nanomaterials; self-assembly
Year: 2020 PMID: 31971302 DOI: 10.1002/adma.201906769
Source DB: PubMed Journal: Adv Mater ISSN: 0935-9648 Impact factor: 30.849