| Literature DB >> 31924767 |
Zhuolu Li1, Shengchun Shen1, Zijun Tian2, Kyle Hwangbo3, Meng Wang1, Yujia Wang1, F Michael Bartram3, Liqun He3, Yingjie Lyu1, Yongqi Dong4,5,6, Gang Wan5, Haobo Li1, Nianpeng Lu1,7, Jiadong Zang8, Hua Zhou4, Elke Arenholz9, Qing He10, Luyi Yang11,12,13, Weidong Luo14,15, Pu Yu16,17,18.
Abstract
Ionic substitution forms an essential pathway to manipulate the structural phase, carrier density and crystalline symmetry of materials via ion-electron-lattice coupling, leading to a rich spectrum of electronic states in strongly correlated systems. Using the ferromagnetic metal SrRuO3 as a model system, we demonstrate an efficient and reversible control of both structural and electronic phase transformations through the electric-field controlled proton evolution with ionic liquid gating. The insertion of protons results in a large structural expansion and increased carrier density, leading to an exotic ferromagnetic to paramagnetic phase transition. Importantly, we reveal a novel protonated compound of HSrRuO3 with paramagnetic metallic as ground state. We observe a topological Hall effect at the boundary of the phase transition due to the proton concentration gradient across the film-depth. We envision that electric-field controlled protonation opens up a pathway to explore novel electronic states and material functionalities in protonated material systems.Entities:
Year: 2020 PMID: 31924767 PMCID: PMC6954193 DOI: 10.1038/s41467-019-13999-1
Source DB: PubMed Journal: Nat Commun ISSN: 2041-1723 Impact factor: 14.919
Fig. 1Electrically controlled proton evolution in SrRuO3 films.
a In-situ XRD θ-2θ scans around the SrRuO3 (002) peak as a function of VG. The new phase is denoted as HSrRuO3. The insets show calculated crystal structures of SrRuO3 and HSrRuO3, respectively, where the blue balls represent hydrogen atoms. b In-situ XRD θ-2θ scans around the SrRuO3 (002) peak as VG cycled between 3.5 V and 0 V, indicating the reversibility of the structural phase transformation. The black dotted lines indicate the peak positions, and the blue and red dash lines denote the change of VG. c Hydrogen distribution profiles within both pristine SrRuO3 film (red solid line) and gated (with VG = 3.5 V and 1.5 V) SrRuO3 films, as measured by ex-situ SIMS. The Ti4+ signature was used as a marker to define the interface between film and substrate. d In-situ XANES spectra at Ru K-edge for pristine SrRuO3 (orange solid line) and protonated HSrRuO3 (blue solid line) at VG = 3.5 V. The XANES spectra at Ru K-edge for Ru metal (black dash line) and RuO2 (gray dash line) are shown as references.
Fig. 2Magnetic evolution via electrically induced protonation.
a Temperature dependent longitudinal resistivity at different VG. The inset shows the corresponding differentiate resistivity d at different VG. A vertical offset of 20 μΩ cm is applied for each curve for clarity. b Magnetic field dependent magnetoresistance (MR) measured at 2 K with different VG. c Magnetic field dependent Hall resistivity measured at 2 K with different VG. The inset shows the VG dependence of carrier density at 2 K. d Temperature dependent anomalous Hall resistivity obtained at μ0H = 0 T with different VG. e Kerr rotation vs. magnetic field results measured at 80 K with different VG. f Kerr rotation as a function of temperature obtained at μ0H = 0 T with different VG. The slightly varied threshold gate voltages among transport, MOKE and XRD measurements are attributed to the different device configurations.
Fig. 3Mechanism for the protonation induced magnetic phase transition.
a, b, Calculated electronic band structures for (a) pristine SrRuO3 and (b) HSrRuO3 with nonmagnetic General Gradient Approximation (GGA) calculations. c Spin-resolved density of states for pristine SrRuO3 and protonated HSrRuO3 calculated by GGA. d Calculated Stoner criterion parameter IN0 and c-axis lattice parameter as a function of hydrogen concentration. The green points are the experimental lattice parameters (doubled of the pseudo-cubic lattice constant) obtained from the in-situ XRD measurements. Following the Stoner criterion, when IN0 becomes smaller than 1 with the increase of hydrogen concentration, the ferromagnetic (FM) SrRuO3 transits into a paramagnetic (PM) metal. The error bars are calculated from different possible HSrRuO3 crystalline structures.
Fig. 4Emergence of topological Hall effect in HSrRuO3.
a Ex-situ measured proton distribution profile in a sample (~32 nm) with topological Hall effect. b P-polarized SHG intensity as a function of the polarization direction of the incident light (0 corresponds to s-polarization) for both pristine SrRuO3 and gated HSrRuO3 films. The weaker SHG in the pristine film is due to surface contributions, while the enhanced SHG intensity of the HxSrRuO3 state suggests the breaking of inversion symmetry in bulk. c Magnetic field dependent Hall resistivity for HSrRuO3 gated with VG = 1.8 V at different temperatures. The blue and red arrows denote the field sweeping direction. Ordinary Hall term is subtracted through the linear fitting of RHB at higher magnetic fields. An offset is applied per curve for clarity, while the dotted lines denote the center of the hysteresis loops. The estimated topological Hall resistivity with different signs is marked with different colors. d Color map of estimated topological hall resistivity and characteristic fields (HC and HP) obtained at HSrRuO3 gated with VG = 1.8 V. HC (black filled symbol) represents the coercive field and the HP (white open diamond) denotes the field where the topological Hall resistivity reaches its maximum.