| Literature DB >> 31921523 |
Zhihua Fu1, Tatjana Ladnorg1, Hartmut Gliemann1, Alexander Welle1, Asif Bashir2,3, Michael Rohwerder2, Qiang Zhang1, Björn Schüpbach4, Andreas Terfort4, Christof Wöll1.
Abstract
We present a new approach to study charge transport within 2D layers of organic semi-conductors (OSCs) using atomic force microscopy (AFM)-based lithography applied to self-assembled monolayers (SAMs), fabricated from appropriate organothiols. The extent of lateral charge transport was investigated by insulating pre-defined patches within OSC-based SAMs with regions of insulating SAM made from large band gap alkanethiolates. The new method is demonstrated using a phenyl-linked anthracenethiolate (PAT), 4-(anthracene-2-ylethynyl)benzyl thiolate. I-V characteristics of differently shaped PAT-islands were measured using the AFM tip as a top electrode. We were able to determine a relationship between island size and electrical conductivity, and from this dependence, we could obtain information on the lateral charge transport and charge carrier mobility within the thin OSC layers. Our study demonstrates that AFM nanografting of appropriately functionalized OSC molecules provides a suitable method to determine intrinsic mobilities of charge carriers in OSC thin films. In particular, this method is rather insensitive with regard to influence of grain boundaries and other defects, which hamper the application of conventional methods for the determination of mobilities in macroscopic samples.Entities:
Keywords: conducting atomic force microscopy; lateral charge transport; nanografting; organic semiconductor; self-assembled monolayer
Year: 2019 PMID: 31921523 PMCID: PMC6941449 DOI: 10.3762/bjnano.10.235
Source DB: PubMed Journal: Beilstein J Nanotechnol ISSN: 2190-4286 Impact factor: 3.649
Figure 1(a), (b) and (c) show STM height images of a PAT SAM on gold at different magnifications describing the molecular structure of the SAM. The unit cell is marked as a parallelogram in (c) with a single domain with the structure (2√3 × 4√3)R30°. (d) The height profiles along the two lines in the topography image of (c) labeled with 1 and 2. (e) Structural formula of the compound used to prepare the PAT SAMs, and (f) the schematic side-view illustration of the aligned adjacent molecules in the PAT SAM. (g) A top-view hard sphere structure model of the PAT-SAM.
Figure 2(a) Topography and (b) the corresponding 3D current image (DC bias: 11.1 mV, current sensitivity range: 0–100 pA) of islands obtained from HDT matrix inserted into the PAT SAM. (c) Enlarged topography view of different islands which are marked with a dotted frame shown. (d) Resistances measured for different PAT islands as a function of island diameter. The black line shows the result of a fit in the diameter interval 20–160 nm by using Equation 1.
Figure 3a) Simple model of resistance within a single thiol molecule on the gold(111) surface. b) Model of charge transfer within a continuous SAM. The number of parallel resistors depends on the island size. The PAT is shown schematically in blue with the S anchor group on a gold surface, while the respective resistances are shown laterally and within the thiol.