Literature DB >> 31873438

Alignment methods for nanotomography with deep subpixel accuracy.

Michal Odstrčil, Mirko Holler, Jörg Raabe, Manuel Guizar-Sicairos.   

Abstract

As the resolution of X-ray tomography improves, the limited long-term stability and accuracy of nanoimaging tools does not allow computing artifact-free three-dimensional (3D) reconstructions without an additional step of numerical alignment of the measured projections. However, the common iterative alignment methods are significantly more computationally demanding than a simple tomographic reconstruction of the acquired volume. Here, we address this issue and present an alignment toolkit, which exploits methods with deep-subpixel accuracy combined with a multi-resolution scheme. This leads to robust and accurate alignment with significantly reduced computational and memory requirements. The performance of the presented methods is demonstrated on simulated and measured datasets for tomography and also laminography acquisition geometries. A GPU accelerated implementation of our alignment framework is publicly available.

Year:  2019        PMID: 31873438     DOI: 10.1364/OE.27.036637

Source DB:  PubMed          Journal:  Opt Express        ISSN: 1094-4087            Impact factor:   3.894


  7 in total

1.  Sparse ab initio x-ray transmission spectrotomography for nanoscopic compositional analysis of functional materials.

Authors:  Zirui Gao; Michal Odstrcil; Sebastian Böcklein; Dennis Palagin; Mirko Holler; Dario Ferreira Sanchez; Frank Krumeich; Andreas Menzel; Marco Stampanoni; Gerhard Mestl; Jeroen Anton van Bokhoven; Manuel Guizar-Sicairos; Johannes Ihli
Journal:  Sci Adv       Date:  2021-06-09       Impact factor: 14.136

2.  LamNI - an instrument for X-ray scanning microscopy in laminography geometry.

Authors:  Mirko Holler; Michal Odstrčil; Manuel Guizar-Sicairos; Maxime Lebugle; Ulrich Frommherz; Thierry Lachat; Oliver Bunk; Joerg Raabe; Gabriel Aeppli
Journal:  J Synchrotron Radiat       Date:  2020-04-06       Impact factor: 2.616

3.  Thermal Drift Correction for Laboratory Nano Computed Tomography via Outlier Elimination and Feature Point Adjustment.

Authors:  Mengnan Liu; Yu Han; Xiaoqi Xi; Siyu Tan; Jian Chen; Lei Li; Bin Yan
Journal:  Sensors (Basel)       Date:  2021-12-20       Impact factor: 3.576

4.  Real-time 3D analysis during electron tomography using tomviz.

Authors:  Jonathan Schwartz; Chris Harris; Jacob Pietryga; Huihuo Zheng; Prashant Kumar; Anastasiia Visheratina; Nicholas A Kotov; Brianna Major; Patrick Avery; Peter Ercius; Utkarsh Ayachit; Berk Geveci; David A Muller; Alessandro Genova; Yi Jiang; Marcus Hanwell; Robert Hovden
Journal:  Nat Commun       Date:  2022-08-01       Impact factor: 17.694

5.  Environmental control for X-ray nanotomography.

Authors:  Mirko Holler; Tomas Aidukas; Lars Heller; Christian Appel; Nicholas W Phillips; Elisabeth Müller-Gubler; Manuel Guizar-Sicairos; Jörg Raabe; Johannes Ihli
Journal:  J Synchrotron Radiat       Date:  2022-07-21       Impact factor: 2.557

6.  Multiscale Dense U-Net: A Fast Correction Method for Thermal Drift Artifacts in Laboratory NanoCT Scans of Semi-Conductor Chips.

Authors:  Mengnan Liu; Yu Han; Xiaoqi Xi; Linlin Zhu; Shuangzhan Yang; Siyu Tan; Jian Chen; Lei Li; Bin Yan
Journal:  Entropy (Basel)       Date:  2022-07-13       Impact factor: 2.738

7.  PtychoShelves, a versatile high-level framework for high-performance analysis of ptychographic data.

Authors:  Klaus Wakonig; Hans-Christian Stadler; Michal Odstrčil; Esther H R Tsai; Ana Diaz; Mirko Holler; Ivan Usov; Jörg Raabe; Andreas Menzel; Manuel Guizar-Sicairos
Journal:  J Appl Crystallogr       Date:  2020-03-13       Impact factor: 3.304

  7 in total

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