| Literature DB >> 31869569 |
Soroosh Sharifi-Asl1, Vitaliy Yurkiv1, Arturo Gutierrez2, Meng Cheng1, Mahalingam Balasubramanian3, Farzad Mashayek1, Jason Croy2, Reza Shahbazian-Yassar1.
Abstract
Despite their high energy densities, Li- and Mn-rich, layered-layered, xLi2MnO3·(1 - x)LiTMO2 (TM = Ni, Mn, Co) (LMR-NMC) cathodes require further development in order to overcome issues related to bulk and surface instabilities such as Mn dissolution, impedance rise, and voltage fade. One promising strategy to modify LMR-NMC properties has been the incorporation of spinel-type, local domains to create "layered-layered-spinel" cathodes. However, precise control of local structure and composition, as well as subsequent characterization of such materials, is challenging and elucidating structure-property relationships is not trivial. Therefore, detailed studies of atomic structures within these materials are still critical to their development. Herein, aberration corrected-scanning transmission electron microscopy (AC-STEM) is utilized to study atomic structures, prior to and subsequent to electrochemical cycling, of LMR-NMC materials having integrated spinel-type components. The results demonstrate that strained grain boundaries with various atomic configurations, including spinel-type structures, can exist. These high energy boundaries appear to induce cracking and promote dissolution of Mn by increasing the contact surface area to electrolyte as well as migration of Ni during cycling, thereby accelerating performance degradation. These results present insights into the important role that local structures can play in the macroscopic degradation of the cathode structures and reiterate the complexity of how synthesis and composition affect structure-electrochemical property relationships of advanced cathode designs.Entities:
Keywords: Li-ion battery; Li-rich cathodes; STEM/EELS; grain boundary; layered oxide cathodes; structural degradation
Year: 2020 PMID: 31869569 DOI: 10.1021/acs.nanolett.9b04620
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189