Literature DB >> 31868739

Optical constants of sputtered beryllium thin films determined from photoabsorption measurements in the spectral range 20.4-250 eV.

Mikhail Svechnikov1, Nikolay Chkhalo1, Alexey Lopatin1, Roman Pleshkov1, Vladimir Polkovnikov1, Nikolay Salashchenko1, Franz Schäfers2, Mewael G Sertsu2, Andrey Sokolov3, Nikolay Tsybin1.   

Abstract

In this work, the refractive index of beryllium in the photon energy range 20.4-250 eV was experimentally determined. The initial data include measurements of the transmittance of two free-standing Be films with thicknesses of 70 nm and 152 nm, as well as reflectometric measurements of similar films on a substrate. Measurements were carried out at the optics beamline of the BESSY II synchrotron radiation source. The absorption coefficient β was found directly from the transmission coefficient of the films, and the real part of the polarizability δ was calculated from the Kramers-Kronig relations. A comparison is carried out with results obtained 20 years ago at the ALS synchrotron using a similar methodology.

Entities:  

Keywords:  beryllium; free-standing thin film; near-edge X-ray absorption fine-structure spectroscopy; optical constants; photoabsorption; refractive index

Year:  2020        PMID: 31868739     DOI: 10.1107/S1600577519014188

Source DB:  PubMed          Journal:  J Synchrotron Radiat        ISSN: 0909-0495            Impact factor:   2.616


  1 in total

1.  A New Approach to the Formation of Nanosized Gold and Beryllium Films by Ion-Beam Sputtering Deposition.

Authors:  Sergei A Sharko; Aleksandra I Serokurova; Nikolai N Novitskii; Valerii A Ketsko; Maria N Smirnova; Aljawhara H Almuqrin; M I Sayyed; Sergei V Trukhanov; Alex V Trukhanov
Journal:  Nanomaterials (Basel)       Date:  2022-01-29       Impact factor: 5.076

  1 in total

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