| Literature DB >> 31835752 |
Jefferson F D F Araujo1, Andre L A Reis2, Angela A P Correa3, Elder Yokoyama3, Vanderlei C Oliveira2, Leonardo A F Mendoza4, Marcos A C Pacheco5, Cleanio Luz-Lima6, Amanda F Santos1, Fredy G Osorio G1, Giancarlo E Brito7, Wagner W R Araujo7, Antonio C Bruno1, Tommaso Del Rosso1.
Abstract
Scanning magnetic microscopy is a tool that has been used to map magnetic fields with good spatial resolution and field sensitivity. This technology has great advantages over other instruments; for example, its operation does not require cryogenic technology, which reduces its operational cost and complexity. Here, we presented a spatial domain technique based on an equivalent layer approach for processing the data set produced by magnetic microscopy. This approach estimated a magnetic moment distribution over a fictitious layer composed by a set of dipoles located below the observation plane. For this purpose, we formulated a linear inverse problem for calculating the magnetic vector and its amplitude. Vector field maps are valuable tools for the magnetic interpretation of samples with a high spatial variability of magnetization. These maps could provide comprehensive information regarding the spatial distribution of magnetic carriers. In addition, this approach might be useful for characterizing isolated areas over samples or investigating the spatial magnetization distribution of bulk samples at the micro and millimeter scales. This technique could be useful for many applications that require samples that need to be mapped without a magnetic field at room temperature, including rock magnetism.Entities:
Keywords: equivalent-layer technique; geological sample; magnetic measurements; scanning magnetic microscopy
Year: 2019 PMID: 31835752 PMCID: PMC6947304 DOI: 10.3390/ma12244154
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Figure 1(a) Diagram of the main components of the microscope: circuit board containing the gradiometric sensors (A and B) and sample holder, which moves in the X and Y directions. All equipment is inside a magnetic shield. The diagram is not drawn to scale. (b) Photo of the Hall sensors coupled in an acrylic structure.
Figure 2(a) Acrylic sample holder with a cylindrical cavity in which the 99% purity nickel sphere was placed. (b) Map of the remnant magnetization of the nickel sphere after being magnetized by a 0.5 T magnetic field. (c) Map of the remnant magnetization of iron oxide nanoparticles. (d) Map of the remnant magnetization of the sphere measured using only circuit boards after a demagnetization process. (e) Map of the remnant magnetization of the same sphere measured using the commercial Lock-In amplifier after a demagnetization process. (f) A figure representing microparticles of iron oxide. (g) Map of the remnant magnetization of iron oxide microparticles.
Figure 3(a) Photo representing a sample taken from the Brazilian state of Tocantins. (b) Magnetic map of the Parnaíba sample representing the natural remanent magnetization. (c) Magnetic map of Parnaíba sample after applying 200 mT. (d) Magnetic map of Parnaíba sample after applying 400 mT.
Figure 4Application of the equivalent-layer technique to microscopy data from the Parnaíba basin sample. (a) Observed z-component measured by the magnetic microscope. (b) Estimated z-component produced by the layer. (c) Difference between panels (a,b). (d) Histogram of the residuals.
Figure 5Magnetic vector components of the Parnaíba basin sample calculated from the equivalent-layer technique. (a) Map of estimated z-component. (b) Map of estimated x-component. (c) Map of the estimated y-component. (d) Amplitude calculated from the estimated magnetic field components.
Figure 6(a) Photo of the Vredefort sample. (b) Magnetic map of the Vredefort sample representing the natural remanent magnetization. (c) Magnetic map of Vredefort sample after applying 200 mT. (d) Magnetic map of Vredefort sample after applying 400 mT.
Figure 7Application of the equivalent-layer technique to microscopy data from the Vredefort sample. (a) Observed z-component measured by the magnetic microscope. (b) Estimated z-component produced by the layer. (c) Difference between panels (a,b). (d) Histogram of the residuals.
Figure 8Magnetic vector components of the Vredefort sample calculated from the equivalent-layer technique. (a) Map of estimated z-component. (b) Map of estimated x-component. (c) Map of estimated y-component. (d) Amplitude calculated from the estimated magnetic field components.