| Literature DB >> 31796786 |
Thomas Thersleff1, Linus Schönström2,3, Cheuk-Wai Tai2, Roman Adam4, Daniel E Bürgler4, Claus M Schneider4, Shunsuke Muto5, Ján Rusz3.
Abstract
Measuring magnetic moments in ferromagnetic materials at atomic resolution is theoretically possible using the electron magnetic circular dichroism (EMCD) technique in a (scanning) transmission electron microscope ((S)TEM). However, experimental and data processing hurdles currently hamper the realization of this goal. Experimentally, the sample must be tilted to a zone-axis orientation, yielding a complex distribution of magnetic scattering intensity, and the same sample region must be scanned multiple times with sub-atomic spatial registration necessary at each pass. Furthermore, the weak nature of the EMCD signal requires advanced data processing techniques to reliably detect and quantify the result. In this manuscript, we detail our experimental and data processing progress towards achieving single-pass zone-axis EMCD using a patterned aperture. First, we provide a comprehensive data acquisition and analysis strategy for this and other EMCD experiments that should scale down to atomic resolution experiments. Second, we demonstrate that, at low spatial resolution, promising EMCD candidate signals can be extracted, and that these are sensitive to both crystallographic orientation and momentum transfer.Entities:
Year: 2019 PMID: 31796786 PMCID: PMC6890689 DOI: 10.1038/s41598-019-53373-1
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1(a) Design of the aperture holding arm suspending the aperture into the beam path. (b) The aperture plate. This design includes one slit (right) and one 8-blade mirror-symmetry patterned aperture (left). Switching between the two was accomplished by venting the chamber and adjusting the position. The large annular holes permit the use of the lower HAADF detector. (c) Placement of the aperture table into the TEM camera chamber.
Figure 2(a) Experimental diffraction pattern recorded on the GIF CCD showing the electron optical conditions. The probe was centered on the grain of interest (see Fig. 3). (b) 2D EELS spectrum acquired using the electron optical conditions presented in (a). The axis represents the momentum transfer that would be expected for a slit oriented normal to the spectrometer dispersion plane. The oxygen edge visible at 532 eV comes from the AlO capping layer and is primarily dominant in the background regions. The magenta brackets denote the angular span of the EMCD sign inversion on Fe observed in Fig. 9.
Figure 3(a) Virtual HAADF of the 4D STEM datacube over the grain of interest. The CBED patterns acquired at pixel position “A” and “B” are shown in (b) and (c), respectively. A gamma curve of 0.3 is applied to the grayscale mapping in these two images to enhance the visibility of the otherwise very weak Kikuchi lines, which are indexed and highlighted in cyan. The center of the reflection is denoted with a red dot. The virtual aperture used to generate the VDF micrograph in figure 4c is also labeled and presented in yellow. (d) Summation over and for the 4D EELS datacube. The 2D EELS spectra from pixel positions “A” and “B” are presented in (e) and (f), respectively.
Figure 9–EMCD maps for the three different ROI masks. The color scale denotes the fraction of the EMCD difference signal with respect to the maximum intensity of the Fe peak.
Figure 4(a) Real-space micrograph created by using a virtual bright field aperture. (b) ROI selection using a threshold for the full grain mask. (c) Real-space micrograph created by using the virtual dark field aperture presented in figure 3. (d) The two orientation masks, “Orient 01” and “Orient 02” were generated by thresholding this image, and both are composited here. The exact thresholding parameters are provided in the supplementary information.
Figure 5Candidate EMCD signal taken from the outer-most range and the spatial mask restricted to the region oriented closest to the Fe [100] zone-axis.
Figure 6Candidate EMCD signal taken from the outer-most range and the mask restricted to the region oriented furthest from the Fe [100] zone axis.
Figure 7Candidate EMCD signal taken from the full range and the mask covering the entire zone-axis oriented grain.
Figure 8Candidate EMCD signal taken from the outer-most range and the mask covering the entire zone-axis oriented grain.
Constraints for the parameters passed to fmincon in the EMCD signal extraction. Note that the EMCD amplitudes were not constrained to be positive and negative as above; rather, they were constrained to have opposite sign from each other.
| Parameter Description | Symbol | Lower bound | Upper bound |
|---|---|---|---|
| Chiral plus pre-edge amplitude | 0 | + | |
| Chiral minus pre-edge amplitude | 0 | + | |
| Chiral plus pre-edge slope | −5 | 0 | |
| Chiral minus pre-edge slope | −5 | 0 | |
| Chiral minus sharpening scalar | −4 | 4 | |
| Chiral minus shift | −3 | 3 | |
| Post-edge normalization slope | − | + | |
| Post-edge normalization intercept | − | + | |
| EMCD amplitude | 0 | + | |
| EMCD broadening a | 0 | 5.0 | |
| EMCD broadening b | 0 | 5.0 | |
| EMCD center | 700 | 712 | |
| EMCD amplitude | − | 0 | |
| EMCD broadening a | 0 | 5.0 | |
| EMCD broadening b | 0 | 5.0 | |
| EMCD center | 716 | 725 | |
| Lorentzian/Gaussian mixing parameter | 0 | 1 |