| Literature DB >> 31730748 |
Pavel Aseev1, Guanzhong Wang2, Luca Binci2, Amrita Singh2, Sara Martí-Sánchez3, Marc Botifoll3, Lieuwe J Stek2, Alberto Bordin2, John D Watson1, Frenk Boekhout1,4, Daniel Abel1, John Gamble5, Kevin Van Hoogdalem1, Jordi Arbiol3,6, Leo P Kouwenhoven1,2, Gijs de Lange1, Philippe Caroff1.
Abstract
Selective area growth is a promising technique to realize semiconductor-superconductor hybrid nanowire networks, potentially hosting topologically protected Majorana-based qubits. In some cases, however, such as the molecular beam epitaxy of InSb on InP or GaAs substrates, nucleation and selective growth conditions do not necessarily overlap. To overcome this challenge, we propose a metal-sown selective area growth (MS SAG) technique, which allows decoupling selective deposition and nucleation growth conditions by temporarily isolating these stages. It consists of three steps: (i) selective deposition of In droplets only inside the mask openings at relatively high temperatures favoring selectivity, (ii) nucleation of InSb under Sb flux from In droplets, which act as a reservoir of group III adatoms, done at relatively low temperatures, favoring nucleation of InSb, and (iii) homoepitaxy of InSb on top of the formed nucleation layer under a simultaneous supply of In and Sb fluxes at conditions favoring selectivity and high crystal quality. We demonstrate that complex InSb nanowire networks of high crystal and electrical quality can be achieved this way. We extract mobility values of 10 000-25 000 cm2 V-1 s-1 consistently from field-effect and Hall mobility measurements across single nanowire segments as well as wires with junctions. Moreover, we demonstrate ballistic transport in a 440 nm long channel in a single nanowire under a magnetic field below 1 T. We also extract a phase-coherent length of ∼8 μm at 50 mK in mesoscopic rings.Entities:
Keywords: InSb; droplet epitaxy; molecular beam epitaxy; selective area growth
Year: 2019 PMID: 31730748 DOI: 10.1021/acs.nanolett.9b04265
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189