| Literature DB >> 31721750 |
Ichiro Inoue1, Kenji Tamasaku1, Taito Osaka1, Yuichi Inubushi1, Makina Yabashi1.
Abstract
A simple method using X-ray fluorescence is proposed to diagnose the duration of an X-ray free-electron laser (XFEL) pulse. This work shows that the degree of intensity correlation of the X-ray fluorescence generated by irradiating an XFEL pulse on metal foil reflects the magnitude relation between the XFEL duration and the coherence time of the fluorescence. Through intensity correlation measurements of copper Kα fluorescence, the duration of 12 keV XFEL pulses from SACLA was evaluated to be ∼10 fs.Entities:
Keywords: X-ray fluorescence; X-ray free-electron lasers; intensity correlation
Year: 2019 PMID: 31721750 DOI: 10.1107/S1600577519011202
Source DB: PubMed Journal: J Synchrotron Radiat ISSN: 0909-0495 Impact factor: 2.616