| Literature DB >> 31717599 |
Abstract
Recently, thanks to the miniaturization and high performance of commercial-off-the-shelf(COTS) computer systems, small satellites get popular. However, due to the very expensive launchingcost, it is critical to reduce the physical size and weight of the satellite systems such as cube satellites(CubeSats), making it infeasible to install high capacity batteries or solar panels. Thus, the low-powerdesign is one of the most critical issues in the design of such systems. In addition, as satellitesmake a periodic revolution around the Earth in a vacuum, their operating temperature varies greatly.For instance, in a low earth orbit (LEO) CubeSats, the temperatures vary from 30 to -30 degreesCelsius, resulting in a big thermal cycle (TC) in the electronic parts that is known to be one of themost critical reliability threats. Moreover, such LEO CubeSats are not fully protected by activethermal control and thermal insulation due to the cost, volume, and weight problems. In thispaper, we propose to utilize temperature sensors to maximize the lifetime reliability of the LEOsatellite systems via multi-core mapping and dynamic voltage and frequency scaling (DVFS) underpower constraint. As conventional reliability enhancement techniques primarily focus on reducingthe temperature, it may cause enlarged TCs, making them even less reliable. On the contrary,we try to maintain the TC optimal in terms of reliability with respect to the given power constraint.Experimental evaluation shows that the proposed technique improves the expected lifetime of thesatellite embedded systems by up to 8.03 times in the simulation of Nvidia's Jetson TK1.Entities:
Keywords: dynamic voltage and frequency scaling (DVFS); low earth orbit satellites; multi-core processor; reliability; temperature sensors, real-time embedded systems
Year: 2019 PMID: 31717599 PMCID: PMC6891388 DOI: 10.3390/s19224902
Source DB: PubMed Journal: Sensors (Basel) ISSN: 1424-8220 Impact factor: 3.576
Figure 1Temperature measurements in SwissCube [10] (BAT: battery, EXT: external, PCB: printed circuit board, and MB: motherboard).
Figure 2Overall procedure of the proposed mapping/DVFS technique.
Figure 3(a) Example temperature traces compared in the binary search and (b) the truncated envelope temperature and the temperature threshold.
Figure 4Temperature profiles of caused (a) by Xian et al. [34] and (b) by the proposed technique without virtual task injections.
Comparisons of , average power consumption, and normalized MTTF.
| Figure | 4(a) | 4(b) | 5(a) | 5(b) | 5(c) | 5(d) | 5(e) | 5(f) |
|---|---|---|---|---|---|---|---|---|
| − | 24.11 | −6.89 | −2.89 | 7.11 | 14.11 | 19.11 | 24.11 | |
| Average Power (W) | 3.79 | 4.59 | 3.81 | 3.89 | 4.11 | 4.35 | 4.53 | 4.81 |
| Normalized MTTF | 1 | 5.48 | 1.02 | 1.32 | 2.24 | 3.65 | 4.89 | 8.03 |
Figure 5Temperature profiles asb of with the proposed technique using virtual tasks and DVFS under different power constraint: (a) W, (b) W, (c) W, (d) W, (e) W, and (f) W.