| Literature DB >> 31684093 |
Yi-Jui Chiu1, Sheng-Rui Jian2, Jyh-Wei Lee3,4,5, Jenh-Yih Juang6.
Abstract
The deformation behaviors and fracture features of GaP(100) single-crystal are investigated by using nano- and micro-scale indentation techniques. The hardness and Young's modulus were measured by nanoindentation using a Berkovich diamond indenter with continuous contact stiffness measurements (CSM) mode and the values obtained were 12.5 ± 1.2 GPa and 152.6 ± 12.8 GPa, respectively. In addition, the characteristic "pop-in" was observed in the loading portion of load-displacement curve, which was caused by the nucleation and/or propagation of dislocations. An energetic estimation methodology on the associated nanoindentation-induced dislocation numbers resulting from the pop-in events was discussed. Furthermore, the Vickers indentation induced fracture patterns of GaP(100) single-crystal were observed and analyzed using optical microscopy. The obtained fracture toughness KC of GaP(100) single-crystal was ~1.7 ± 0.1 MPa·m1/2, which is substantially higher than the KIC values of 0.8 MPa·m1/2 and 1.0 MPa·m1/2 previously reported for of single-crystal and polycrystalline GaP, respectively.Entities:
Keywords: GaP(100) single crystal; fracture; nanoindentation; pop-in
Year: 2019 PMID: 31684093 PMCID: PMC6915560 DOI: 10.3390/mi10110752
Source DB: PubMed Journal: Micromachines (Basel) ISSN: 2072-666X Impact factor: 2.891
Figure 1(a) Ten contact stiffness measurements (CSM) load-displacement curves show the “pop-in” events of GaP(100) single-crystal during nanoindentation. Insert: zoom in the range of penetration depth (0–70 nm) and indentation load (0–1.5 mN). (b) AFM image of the nanoindentation.
Figure 2Hardness and Young’s modulus of GaP(100) single-crystal. (a) the hardness and (b) Young’s modulus as a function of penetration depth (100 and 200 nm) from nanoindentation CSM results.
The hardness and Young’s modulus of various semiconductor materials.
| Materials | ||
|---|---|---|
| Single-crystal GaP(100) [#] | 12.5 ± 1.2 | 152.6 ± 12.8 |
| Single-crystal GaP [ | 10.9 ± 0.2 (10 mN); 12.5 ± 0.2 (1 mN) | 147 ± 5 |
| Single-crystal GaAs(100) [ | 7.5 | 97 |
| Single-crystal GaAs [ | 8.4 ± 0.1 | 123 ± 1 |
| GaAs(100) thin films [ | 10.62 ± 0.3 | 118.97 ± 3.81 |
| Single-crystal InP(100) [ | 5.1 | 82 |
| InP layer [ | 6.83 ± 0.71 | 97.1 ± 0.68 |
| InP substrate [ | 6.41 ± 0.25 | 90.12 ± 1.59 |
| Single-crystal ZnSe [ | 1.47 ± 0.02 | 72 ± 2 |
| ZnSe thin films [ | 2.0 ± 0.1 | 72.6 ± 0.5 |
| Bulk InAs [ | 5 | 69.9 |
| InAs layer [ | 7.8 | 100 |
| Bulk ZnS [ | 1.9 | 75 |
| ZnTe(111) thin films [ | 4 | 70 |
[#]: this study
Figure 3Palmqvist cracks obtained from Vickers indentation on GaP(100) single-crystal, where “a” is the half-diagonal of the indentation and “l = (l1 + l2)/4” is the average length of the radial cracks for each indentation under a load of 1.96 N.