| Literature DB >> 31658453 |
Ji Xu1, Hai Hu, Wenxin Yang, Chi Li, Yutong Shi, Yongjiao Shi, Qilong Wang, Xiaobing Zhang.
Abstract
High quality nanoscale vacuum channel transistors (NVCTs) enable carriers to transport ballistically through the vacuum nanogap, achieving high speed and frequency characteristic which are essential for on-chip vacuum electronic devices. However, the studies to date have been largely confined to explore the common electrical performance, while the fast response characteristic of NVCTs remains a challenge. We report the fabrication of metal-based NVCT, with sub-100 nm vacuum channel and specific designed in-plane collection structure which can enhance the emission or collection efficiency of the electrons simultaneously. Importantly, the demonstration of a rise/fall time of less than 100 ns is achieved, which is compatible with those high-quality solid-state transistors based on low-dimensional materials. Moreover, the device can also retain excellent electrical performance, exhibiting a high drive current (>10 μA), low work voltage (<10 V) and high on/off current ratio (>104). The verification of fast temporal response of NVCT makes a significant step towards on-chip vacuum electronics with high speed and integration.Entities:
Year: 2019 PMID: 31658453 DOI: 10.1088/1361-6528/ab51cb
Source DB: PubMed Journal: Nanotechnology ISSN: 0957-4484 Impact factor: 3.874