| Literature DB >> 31641716 |
Ahmed S M Ismail1, Yohei Uemura2, Sang Han Park3, Soonnam Kwon3, Minseok Kim3, Hebatalla Elnaggar1, Federica Frati1, Yasuhiro Niwa4, Hiroki Wadati5, Yasuyuki Hirata6, Yujun Zhang6, Kohei Yamagami6, Susumu Yamamoto6, Iwao Matsuda6, Ufuk Halisdemir7, Gertjan Koster7, Bert M Weckhuysen1, Frank M F de Groot1.
Abstract
Hematite, α-Fe2O3, is an important semiconductor for photoelectrochemical water splitting. Its low charge carrier mobility and the presence of midgap states provide favourable conditions for electron-hole recombination, hence affecting the semiconductor's photoelectrochemical efficiency. The nature of the excited state and charge carrier transport in hematite is strongly debated. In order to further understand the fundamental properties of the hematite photoexcited state, we conducted femtosecond 2p (L3) X-ray absorption (XAS) and 2p3d resonant inelastic scattering (RIXS) measurements on hematite thin-films at the Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL). The observed spectral changes and kinetic processes are in agreement with previous 3p XAS reports. The potential additional information that could be acquired from 2p3d RIXS experiments is also discussed.Entities:
Year: 2019 PMID: 31641716 DOI: 10.1039/c9cp03374b
Source DB: PubMed Journal: Phys Chem Chem Phys ISSN: 1463-9076 Impact factor: 3.676