Literature DB >> 31574497

Fluorite-structure antiferroelectrics.

Min Hyuk Park1, Cheol Seong Hwang.   

Abstract

Ferroelectricity in fluorite-structure oxides like hafnia and zirconia have attracted increasing interest since 2011. Two spontaneous polarizations of the fluorite-structure ferroelectrics are considered highly promising for nonvolatile memory applications, with their superior scalability and Si compatibility compared to the conventional perovskite-structure ferroelectrics. Besides, antiferroelectricity originating from a field-induced phase transition between the paraelectric and ferroelectric phases in fluorite-structure oxides is another highly interesting matter. It was suggested that the field-induced phase transition could be utilized for energy conversions between thermal and electrical energy, as well as for energy storage. The important energy-related applications of antiferroelectric fluorite-structure oxides, however, have not been systematically reviewed to date. Thus, in this work, the fluorite-structure antiferroelectrics are reviewed from their fundamentals to their applications based on pyroelectricity as well as antiferroelectricity. Another important application field of the fluorite-structure antiferroelectrics is the semiconductor memory devices. The fluorite-structure antiferroelectrics can be utilized for antiferroelectric random-access-memories, negative capacitance field-effect-transistors, and flash memories. Moreover, the recently reported morphotropic phase boundary (MPB) between the ferroelectric and antiferroelectric phases in this material system marks another significant progress in this material system, and thus, the fundamentals and applications of the MPB phase are also reviewed.

Entities:  

Year:  2019        PMID: 31574497     DOI: 10.1088/1361-6633/ab49d6

Source DB:  PubMed          Journal:  Rep Prog Phys        ISSN: 0034-4885


  4 in total

1.  Antiferroelectric negative capacitance from a structural phase transition in zirconia.

Authors:  Michael Hoffmann; Zheng Wang; Nujhat Tasneem; Ahmad Zubair; Prasanna Venkatesan Ravindran; Mengkun Tian; Anthony Arthur Gaskell; Dina Triyoso; Steven Consiglio; Kandabara Tapily; Robert Clark; Jae Hur; Sai Surya Kiran Pentapati; Sung Kyu Lim; Milan Dopita; Shimeng Yu; Winston Chern; Josh Kacher; Sebastian E Reyes-Lillo; Dimitri Antoniadis; Jayakanth Ravichandran; Stefan Slesazeck; Thomas Mikolajick; Asif Islam Khan
Journal:  Nat Commun       Date:  2022-03-09       Impact factor: 14.919

2.  Ultrathin ferroic HfO2-ZrO2 superlattice gate stack for advanced transistors.

Authors:  Suraj S Cheema; Nirmaan Shanker; Li-Chen Wang; Cheng-Hsiang Hsu; Shang-Lin Hsu; Yu-Hung Liao; Matthew San Jose; Jorge Gomez; Wriddhi Chakraborty; Wenshen Li; Jong-Ho Bae; Steve K Volkman; Daewoong Kwon; Yoonsoo Rho; Gianni Pinelli; Ravi Rastogi; Dominick Pipitone; Corey Stull; Matthew Cook; Brian Tyrrell; Vladimir A Stoica; Zhan Zhang; John W Freeland; Christopher J Tassone; Apurva Mehta; Ghazal Saheli; David Thompson; Dong Ik Suh; Won-Tae Koo; Kab-Jin Nam; Dong Jin Jung; Woo-Bin Song; Chung-Hsun Lin; Seunggeol Nam; Jinseong Heo; Narendra Parihar; Costas P Grigoropoulos; Padraic Shafer; Patrick Fay; Ramamoorthy Ramesh; Souvik Mahapatra; Jim Ciston; Suman Datta; Mohamed Mohamed; Chenming Hu; Sayeef Salahuddin
Journal:  Nature       Date:  2022-04-06       Impact factor: 69.504

Review 3.  A review on morphotropic phase boundary in fluorite-structure hafnia towards DRAM technology.

Authors:  Minhyun Jung; Venkateswarlu Gaddam; Sanghun Jeon
Journal:  Nano Converg       Date:  2022-10-01

4.  Reversible transition between the polar and antipolar phases and its implications for wake-up and fatigue in HfO2-based ferroelectric thin film.

Authors:  Yan Cheng; Zhaomeng Gao; Kun Hee Ye; Hyeon Woo Park; Yonghui Zheng; Yunzhe Zheng; Jianfeng Gao; Min Hyuk Park; Jung-Hae Choi; Kan-Hao Xue; Cheol Seong Hwang; Hangbing Lyu
Journal:  Nat Commun       Date:  2022-02-03       Impact factor: 14.919

  4 in total

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