| Literature DB >> 31557904 |
Hye Jin Kim1, Heeju Ahn2,3, David S Lee4, Dongsung Park5,6, Jae Hyun Kim7, Jinsik Kim8, Dae Sung Yoon9, Kyo Seon Hwang10.
Abstract
The concentration effect of dielectrophoresis (DEP) enables detection of biomolecules with high sensitivity. In this study, microstructures were patterned between the interdigitated microelectrodes (IMEs) to increase the concentration effect of DEP. The microstructures increased the electric field gradient ( ∇ | E 2 | ) between the IMEs to approximately 6.61-fold higher than in the bare IMEs with a gap of 10 μm, resulting in a decreased optimal voltage to concentrate amyloid beta 42 (Aβ42, from 0.8 Vpp to 0.5 Vpp) and tau-441 (from 0.9 Vpp to 0.6 Vpp) between the IMEs. Due to the concentration effect of DEP, the impedance change in the optimal condition was higher than the values in the reference condition at 2.64-fold in Aβ42 detection and at 1.59-fold in tau-441 detection. This concentration effect of DEP was also verified by counting the number of gold (Au) particles which conjugated with the secondary antibody. Finally, an enhanced concentration effect in the patterned IMEs was verified by measuring the impedance change depending on the concentration of Aβ42 and tau-441. Our results suggest that microstructures increase the concentration effect of DEP, leading to enhanced sensitivity of the IMEs.Entities:
Keywords: amyloid beta 42; concentration effect; dielectrophoresis; high sensitivity; tau-441
Year: 2019 PMID: 31557904 PMCID: PMC6806168 DOI: 10.3390/s19194152
Source DB: PubMed Journal: Sensors (Basel) ISSN: 1424-8220 Impact factor: 3.576
Figure 1Highly sensitive electrical sensor with enhanced concentration effect of dielectrophoresis (DEP). (a) The patterned interdigitated microelectrodes (IMEs) have repetitive square microstructures between the IMEs, (b) reaction between the target molecules and their specific antibodies immobilized on the SiO2 surfaces of the bare IMEs (left) and the patterned IMEs (right), and (c) fabricated IMEs with micropatterns using MEMS technology.
Figure 2Enhancement of the electric field by the micropattern between the IMEs. (a) Intensity of the electric field on the surface of the bare IMEs when 0.5 V was applied, (b) intensity of the and the reaction region corresponding to the gap between the electrodes in the bare IMEs, (c) intensity of the electric field on the surface of the patterned IMEs when 0.5 V was applied, and (d) the value of the per voltage in the bare IMEs (gap: 10 μm) and in the patterned IMEs. The values were calculated through a power series fitting of the dots (y = AxB + CxD) with 95% confidence.
Figure 3Optimization of the DEP condition in both patterned IMEs and bare IMEs. Impedance change by binding of Aβ42 in the (a) bare IMEs and (b) patterned IMEs; impedance change by binding of tau-441 in the (c) bare IMEs and (d) patterned IMEs, respectively. Error bars indicate standard deviations of 5 independent measurements at minimum.
Figure 4SEM images of the Au particles conjugated with secondary antibody on the surface of the IMEs: Bare IMEs surfaces after sequential treatment with (6E10)–(Aβ42)–(12F4) at ‘Ref.’ and at optimal voltage (0.8 Vpp); with (tau-5)–(tau-441)–(7B8) at ‘Ref.’ and at optimal voltage (0.5 Vpp) (a1–a4, respectively); patterned IMEs surfaces after sequential treatment with (6E10)–(Aβ42)–(12F4) at ‘Ref.’ and at optimal voltage (0.9 Vpp); with (tau-5)–(tau-441)–(7B8) at ‘Ref.’ and at optimal voltage (0.6 Vpp) (b1–b4, respectively); (c) Increasing ratio of the number of Au particles by the DEP force in the bare and patterned IMEs.
Figure 5Impedance changes measured in (a) the bare IMEs and (b) the patterned IMEs, respectively, depending on various concentrations of Aβ42 in “DEP” (red) and “Ref” (gray). Dotted lines represent a regression with linearity to estimate the sensitivity. Error bars indicate standard deviations from minimum of 5 independent measurements. (c) Sensitivities calculated by linear regression with 95% confidence of the dotted lines in the bare IMEs (gray) and the patterned IMEs (red). Error bars indicate the standard errors. In addition, impedance changes measured in (d) the bare IMEs and (e) the patterned IMEs depending on the various concentration of tau-441 in the condition of “DEP” (red) and “Ref” (gray). Dotted lines represent a regression with linearity to estimate the sensitivity. Error bars indicate standard deviations from minimum of 5 independent measurements. (f) Sensitivities calculated by linear regression with 95% confidence of the dotted lines in the bare IMEs (gray) and the patterned IMEs (red), respectively. Error bars indicate the standard errors.