| Literature DB >> 31539865 |
Ralf Hielscher1, Felix Bartel2, Thomas Benjamin Britton3.
Abstract
We present spherical analysis of electron backscatter diffraction (EBSD) patterns with two new algorithms: (1) band localisation and band profile analysis using the spherical Radon transform; (2) orientation determination using spherical cross correlation. These new approaches are formally introduced and their accuracies are determined using dynamically simulated patterns. We demonstrate their utility with an experimental dataset obtained from ferritic iron. Our results indicate that the analysis of EBSD patterns on the sphere provides an elegant method of revealing information from these rich sources of crystallographic data.Entities:
Keywords: Cross correlation; Crystallography; Electron diffraction; Electron microscopy; Geometrical projection
Year: 2019 PMID: 31539865 DOI: 10.1016/j.ultramic.2019.112836
Source DB: PubMed Journal: Ultramicroscopy ISSN: 0304-3991 Impact factor: 2.689