| Literature DB >> 31458511 |
Viktor A Ermakov1, José Maria Clemente da Silva Filho1, Luiz Gustavo Bonato2, Naga Vishnu Vardhan Mogili3, Fabiano Emmanuel Montoro3, Fernando Iikawa1, Ana Flavia Nogueira2, Carlos Lenz Cesar1,4, Ernesto Jiménez-Villar1,5, Francisco Chagas Marques1.
Abstract
In the last two decades, many experiments were conducted in self-organization of nanocrystals into two- and three-dimensional (3D) superlattices and the superlattices were synthesized and characterized by different techniques, revealing their unusual properties. Among all characterization techniques, X-ray diffraction (XRD) is the one that has allowed the confirmation of the 3D superlattice formation due to the presence of sharp and intense diffraction peaks. In this work, we study self-organized superlattices of quantum dots of PbS prepared by dropping a monodispersed colloidal solution on a glass substrate at different temperatures. We showed that the intensity of the low-angle XRD peaks depends strongly on the drying time (substrate temperature). We claim that the peaks are originated from the 3D superlattice. Scanning electron microscopy images show that this 3D superlattice (PbS quantum dots) is formed in flake's shape, parallel to the substrate surface and randomly oriented in the perpendicular planes.Entities:
Year: 2018 PMID: 31458511 PMCID: PMC6641286 DOI: 10.1021/acsomega.7b01791
Source DB: PubMed Journal: ACS Omega ISSN: 2470-1343
Figure 1(a) Films of PbS quantum dots, prepared by drop casting of initial solution of quantum dots of PbS and dried at different temperatures; (b) size distribution of nanocrystals; (c) absorption and photoluminescence (PL) spectra of initial solution of PbS quantum dots; (d) XRD pattern of the quantum dots after preparation recorded in 20–90° range (blue lines indicate position and relative intensity of the bulk PbS crystal from ref (34)).
Figure 2Characterization of organized films of quantum dots: (a) low-angle XRD patterns show an intensity decrease in the peaks associated with arrangement of quantum dots with decrease of drying time (for convenience, XRD patterns are shifted: 300 s, 7000 counts; 110 s, 3000 counts; 50 s, 2000 counts), inset: intensity of the XRD peaks vs peak position (dots) and exponential decay fitting (dashed lines); (b) XRD spectra (20–50°) of the samples show similar intensities of fcc PbS peaks (111), (200), and (220) at different drying times; (c) illustration of the decrease of the 3rd peak at 5.24° (presented in (a)) located at ∼5.2°, with decrease of the drying time; (d) dependence of this 3rd peak on the drying time; (e) SEM image of the sample dried for 300 s, showing formation of the superlattices in the form of flakes randomly oriented in the planes perpendicular to the sample surface; (f) SEM image of the same sample taken at higher magnification; (g) PL spectra of the PbS films show no difference in the position and shape of the PL with decreasing drying time and ∼100 nm shift compared to that of the initial solution.
Order of Diffraction n, Position 2θ°, and Relative Intensity I/I0 of XRD Peaks Observed for Films of Quantum Dots of PbS
| position (2θ°) | position (2θ°) | ||||
|---|---|---|---|---|---|
| 1 | 1.78 | 100 | 8 | 14.02 | 3.9 |
| 2 | 3.5 | 46.2 | 9 | 15.78 | 3.7 |
| 3 | 5.24 | 54.3 | 10 | 17.56 | 2.2 |
| 4 | 7 | 20.5 | 11 | 19.32 | 2.4 |
| 5 | 8.74 | 22.8 | 12 | 21.1 | 1.1 |
| 6 | 10.5 | 8.8 | 13 | 22.88 | 1.0 |
| 7 | 12.24 | 9.2 |