| Literature DB >> 31457747 |
Ane Escobar1, Luis Yate1, Marek Grzelczak1,2, Heinz Amenitsch3, Sergio E Moya1, Andrea V Bordoni4, Paula C Angelomé4.
Abstract
Inorganic-organic hybrid mesoporous silica thin films with covalently bonded carboxylic acid groups were synthesized in a one-step procedure, using carboxylic-derivatized alkoxysilanes obtained by photochemical radical thiol-ene addition (PRTEA). The organosilanes were synthesized by clicking mercaptosuccinic or mercaptoacetic thioacids with vinyltrimethoxysilane, using benzophenone as the photoradical initiator. The films were synthesized by evaporation-induced self-assembly of a sol containing a mixture of tetraethoxysilane and different quantities of the organosilanes, without any further treatment after the PRTEA reaction. Two nonionic surfactants were used as templates to produce different pore sizes. Different aging times were also applied. Structural characterization with electron microscopy, porosimetry measurements, and small angle X-ray scattering with two-dimensional detection demonstrated the obtention of mesoporous phases whose degree of ordering depended on the amount of added organosilane. The incorporation of the functional silanes was shown by X-ray photoelectron spectroscopy, and the presence of the COOH groups was confirmed by Fourier transform infrared (FTIR). Finally, the availability of the COOH groups for further chemical modification was demonstrated by FTIR by following the changes in the typical carbonyl IR bands during proton exchange and metal complexation. The proposed simple methodology allows obtaining COOH-modified silica thin films in one step, without the need of hard reaction conditions or deprotection steps. Functionalization with carboxyl groups brings a pH-dependent switch-ability to the pore surface that can be used for multifunctional mesoporous materials design.Entities:
Year: 2017 PMID: 31457747 PMCID: PMC6641613 DOI: 10.1021/acsomega.7b00560
Source DB: PubMed Journal: ACS Omega ISSN: 2470-1343
Scheme 1Reaction Pathway To Obtain the COOH-Modified Silanes by PRTEA
Figure 1TEM and 2D-SAXS patterns of: (a) SiB-MSA 5% 1 h, (b) SiF-MSA 5% 1 h, (c) SiB-MSA 20% 1 h, and (d) SiF-MSA 20% 1 h thin films.
d1̅10 Interplanar Distances (in nm) Obtained from 2D-SAXS Patterns for the SiF-MSA System
| aging | ||
|---|---|---|
| nominal % of organosilane | 1 h | 24 h |
| 0 | 14.8 | |
| 5 | 13.3 | 13.5 |
| 12.5 | 12.6 | 12.6 |
| 20 | 11.2 | 11.4 |
Figure 2EEP results for (a) SiF-MSA 20% 24 h and (b) SiB-MSA 20% 24 h thin films.
Data Obtained from EEP Measurements
| sample | thickness/nm | porosity/% | pore diameter/nm |
|---|---|---|---|
| SiB-MSA 20% 1 h | 254 | 20 | 2.7 |
| SiB-MSA 20% 24 h | 225 | 19 | 2.1 |
| SiF-MSA 20% 1 h | 285 | 21 | 3.9 |
| SiF-MSA 20% 24 h | 295 | 20 | 4.7 |
Figure 3XPS spectra (a) wide scan for SiB-MSA 20% 1 h system; detailed scan in the S and Si region for SiB-MSA 20% 1 h system (b) and SiB-MSA 5% 1 h system (c).
Atomic Percentages for S and Si and S/Si Relation Calculated from XPS Spectra of the Different Systems Containing the MSA Moiety
| sample | mean S/Si atomic ratio | sample | mean S/Si atomic ratio |
|---|---|---|---|
| SiF-MSA 5% 1 h | 0.017 ± 0.005 | SiF-MSA 5% 24 h | 0.020 ± 0.001 |
| SiF-MSA 12.5% 1 h | 0.045 ± 0.003 | SiF-MSA 12.5% 24 h | 0.048 ± 0.004 |
| SiF-MSA 20% 1 h | 0.060 ± 0.004 | SiF-MSA 20% 24 h | 0.060 ± 0.007 |
| SiB-MSA 5% 1 h | 0.010 ± 0.001 | SiB-MSA 5% 24 h | 0.013 ± 0.002 |
| SiB-MSA 12.5% 1 h | 0.050 ± 0.006 | SiB-MSA 12.5% 24 h | 0.042 ± 0.005 |
| SiB-MSA 20% 1 h | 0.060 ± 0.003 | SiB-MSA 20% 24 h | 0.062 ± 0.005 |
Figure 4DRIFT spectra of scratched films after extraction: (a) SiF, (b) SiF-MSA 20% 1 h, (c) SiF-MSA 20% 1 h after contact with HCl, and (d) SiF-MSA 20% 1 h after contact with Pb2+. Left: wide spectra. Right: enlargement of the COOH region.