Literature DB >> 31422955

Ultra-wide temperature electronic synapses based on self-rectifying ferroelectric memristors.

Nan Yang1, Zhong-Qi Ren, Chuan-Zhu Hu, Zhao Guan, Bo-Bo Tian, Ni Zhong, Ping-Hua Xiang, Chun-Gang Duan, Jun-Hao Chu.   

Abstract

Memristors have been intensively studied in recent years as promising building blocks for next-generation nonvolatile memory, artificial neural networks and brain-inspired computing systems. However, most memristors cannot simultaneously function in extremely low and high temperatures, limiting their use for many harsh environment applications. Here, we demonstrate that the memristors based on high-Curie temperature ferroelectrics can resolve these issues. Excellent synaptic learning and memory functions can be achieved in BiFeO3 (BFO)-based ferroelectric memristors in an ultra-wide temperature range. Correlation between electronic transport and ferroelectric properties is established by the coincidence of resistance and ferroelectricity switch and the direct visualization of local current and domain distributions. The interfacial barrier modification by the reversal of ferroelectric polarization leads to a robust resistance switching behavior. Various synaptic functions including long-term potentiation/depression, consecutive potentiation/depression and spike-timing dependent plasticity have been realized in the BFO ferroelectric memristors over an extremely wide temperature range of -170 °C ∼ 300 °C, which even can be extended to 500 °C due to the robust ferroelectricity of BFO at high temperatures. Our findings illustrate that the BFO ferroelectric memristors are promising candidates for ultra-wide temperature electronic synapse in extreme or harsh environments.

Entities:  

Year:  2019        PMID: 31422955     DOI: 10.1088/1361-6528/ab3c3d

Source DB:  PubMed          Journal:  Nanotechnology        ISSN: 0957-4484            Impact factor:   3.874


  1 in total

Review 1.  Research progress on solutions to the sneak path issue in memristor crossbar arrays.

Authors:  Lingyun Shi; Guohao Zheng; Bobo Tian; Brahim Dkhil; Chungang Duan
Journal:  Nanoscale Adv       Date:  2020-03-11
  1 in total

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