| Literature DB >> 31406176 |
Gaku Okuma1, Shuhei Watanabe1, Kan Shinobe1, Norimasa Nishiyama1, Akihisa Takeuchi2, Kentaro Uesugi2, Satoshi Tanaka3, Fumihiro Wakai4.
Abstract
The characterization of the processing-induced defects is an essential step for developing defect-free processing, which is important to the assurance of structural reliability of brittle ceramics. The multiscale X-ray computed tomography, consisting of micro-CT as a wide-field and low-resolution system and nano-CT as a narrow-field and high-resolution system, is suitable for observing crack-like defects with small length and with very small crack opening displacement. Here we applied this powerful imaging tool in order to reveal the complicated three-dimensional morphology of defects evolved during sintering of alumina. The hierarchical packing structure of granules was the origin of several types of strength-limiting defects, which could not be eliminated due to the differential sintering of heterogeneous microstructures. This imaging technique of internal defects provides a link between the processing and the fracture strength for the development of structural materials.Entities:
Year: 2019 PMID: 31406176 PMCID: PMC6690982 DOI: 10.1038/s41598-019-48127-y
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Micro-CT image of defects on cross-sections of sintered alumina (relative density, ρ = 98%). The axial direction is the direction of uniaxial pressing of the powder.
Figure 2Types of processing-induced defects. (a) Relation between defects and hierarchical powder packing structure. Type I defects arise from intragranule porosity. Type II defects are formed at boundaries among granules. Type III defects are formed from the cavity of hollow granules. (b) SEM image of alumina granules. There are large dimples in large granules, while dimple is small or apparently absent in small granules. (c) 3D micro-CT images of defects in sintered alumina (ρ = 98%). Coarse round-shaped pores (Type I), branched crack-like defects (Type II), and circular crack-like defects (Type III).
Figure 3Nano-CT images of defects. (a–c) Branched crack-like defects (Type II), (d) shallow bowl-shaped crack (Type III).
Figure 4Evolution of defects during sintering. (a) 3D view of defects observed by micro-CT at the initial stage (ρ = 65%) and the final stage (ρ = 98%). (b) Volume fraction of defects. (c) Specific surface area of defects. (d) Size distribution of circular crack-like defects (Type III) in a volume element of 420 × 420 × 1050 µm3.
Figure 5Large strength-limiting defects. (a) Top view of the largest circular crack-like defect (Type III). (b) Top view of the network of branched crack-like defects (Type II). (c) Side view of the network of branched crack-like defects in the direction of white arrow.