| Literature DB >> 31405253 |
Eunji Lee1, Hye Jin Kim2, Yejin Park1, Seungjun Lee1, Sae Youn Lee3, Taewon Ha4, Hyun-Joon Shin5, Youngbaek Kim6, Jinsik Kim7.
Abstract
Solution-based direct patterning on an elastomer substrate with meniscus-dragging deposition (MDD) enables fabrication of very thin carbon nanotube (CNT) layers in the nanometer scale (80-330 nm). To fabricate the CNT pattern with CNT solution, contact angle, electrical variation, mechanical stress, and surface cracks of elastomer substrate were analyzed to identify the optimal conditions of O2 treatment (treatment for 30 s with RF power of 50 W in O2 atmosphere of 50 sccm) and mixture ratio between Ecoflex and polydimethylsiloxane (PDMS) (Ecoflex:PDMS = 5:1). The type of mask for patterning of the CNT layer was determined through quantitative analysis for sharpness and uniformity of the fabricated CNT pattern. Through these optimization processes, the CNT pattern was produced on the elastomer substrate with selected mask (30 μm thick oriented polypropylene). The thickness of CNT pattern was also controlled to have hundreds nanometer and 500 μm wide rectangular and circular shapes were demonstrated. Furthermore, the change in the current and resistance of the CNT layer according to the applied strain on the elastomer substrate was analyzed. Our results demonstrated the potential of the MDD method for direct CNT patterning with high uniformity and the possibility to fabricate a stretchable sensor.Entities:
Keywords: Ecoflex; carbon nanotube (CNT); elastomer; oxygen (O2) plasma; polydimethylsiloxane (PDMS); strain sensor; stretchable sensor
Year: 2019 PMID: 31405253 PMCID: PMC6722655 DOI: 10.3390/mi10080530
Source DB: PubMed Journal: Micromachines (Basel) ISSN: 2072-666X Impact factor: 2.891
Figure 1Schematic of direct patterning at the stretchable substrate. O2 plasma treatment for direct patterning of a carbon nanotube (CNT) by achieving hydrophilicity (left) and CNT deposition by meniscus-dragging deposition (right).
Figure 2Electrical and mechanical properties of mixture of Ecoflex and polydimethylsiloxane (PDMS) varied by O2 plasma treatment time. (A)–(C) Optical images of contact angle (left) and surface crack of elastomer (right). The substrate mixture ratio is (A) Ecoflex:PDMS = 100:0, (B) Ecoflex:PDMS = 10:1, and (C) Ecoflex:PDMS = 5:1. (D) The current–voltage curve of deposited CNT on the substrate (Ecoflex:PDMS = 5:1), (E) by stretching the double-layered substrate to 100% strain, the mechanical stress of three different types of substrate changed in kN/m².
The number of the cross points in the crack lines and mean value and standard deviation for contact angles of water drop on various substrates, according to the treatment time of O2 plasma.
| Mixture Ratio | 100:0 | 10:1 | 5:1 | ||||
|---|---|---|---|---|---|---|---|
| Plasma Time (s) | Contact Angle (°) | Cross Points | Contact Angle (°) | Cross Points | Contact Angle (°) | Cross Points | |
| 0 | 102.32 ± 3.75 | 0 | 102.73 ± 1.29 | 0 | 96.51 ± 2.36 | 0 | |
| 15 | 12.65 ± 2.42 | 0 | 9.76 ± 0.21 | 0 | 10.22 ± 0.46 | 0 | |
| 30 | 10.65 ± 1.39 | 4.8 ± 0.36 | 11.05 ± 0.64 | 2.7 ± 1.15 | 10.14 ± 1.18 | 0.8 ± 0.94 | |
| 45 | 11.02 ± 0.77 | 15.0 ± 5.72 | 11.54 ± 0.67 | 8.30 ± 1.46 | 11.51 ± 0.96 | 13.7 ± 2.71 | |
Thickness of each type of mask.
| Name | Materials | Thickness (μm) |
|---|---|---|
| OHP 100 | Overhead projector film (OHP) | 100 |
| OPP 30 | Oriented polypropylene (OPP) | 30 |
| PI 25 | Polyimide (PI) | 25 |
| Teflon 25 | Teflon | 25 |
| Teflon 50 | Teflon | 50 |
Figure 3Optical properties and thickness of CNT films deposited on elastomer substrate by meniscus-dragging deposition (MDD) for mask selection and showing the thickness and types of patterns, which can be formed by direct patterning. (A) The average values and standard deviation of sharpness (blue, %) and uniformity (red, %) of CNT patterns are varied by masking materials. (B) Optical image of CNT with marked lines and intensity of line profiles when the “OPP 30” mask was used. (C) Thickness of the 1 wt% CNT layer (red) and 1.5 wt% CNT layer (blue) based on the number of CNT depositions and the results of atomic force microscopy (AFM) analysis. Optical images of CNT in (D) a square pattern, (E) a circle pattern, and (F) square arrays with “OPP 30” mask.
Figure 4Electrical and mechanical properties of the encapsulated CNT double layer sensor. Images of the ‘π’ pattern when (A) 0% and (B) 100% strain were applied. (C) Double layer sensor with an Ag nanowire electrode on the CNT. (D) Time–current curves of CNT masked by polyimide film and measured by repeatedly stretching samples at 100% strain. (E) Changes in resistance when the sensor is stretched to 100%. (F) The average values and standard deviation of engineering stress of three CNT line patterns along the X-axis, one along the Y-axis and bare elastomer substrate (mixed by Ecoflex:PDMS = 5:1).