| Literature DB >> 31392178 |
Karan Bansal1, Sachin Gupta2, Vineeta Nikhil2, Shikha Jaiswal3, Akanksha Jain2, Neha Aggarwal4.
Abstract
AIM: The aim is to compare and evaluate the different finishing and polishing systems for the change in surface roughness of resin composites and enamel.Entities:
Keywords: Nanohybrid composite; Shofu; Sof-Lex; profilometer; surface roughness
Year: 2019 PMID: 31392178 PMCID: PMC6652279 DOI: 10.4103/ijabmr.IJABMR_11_19
Source DB: PubMed Journal: Int J Appl Basic Med Res ISSN: 2229-516X
Pair-wise comparison of the mean surface roughness values (Ra in µm) for composite restoration between different groups (paired t-test)
| Paired comparison | |
|---|---|
| Group A (0.089 µm) versus Subgroup BF (Pr) (0.743 µm) | <0.001 |
| Group A (0.089 µm) versus Subgroup BX (Pr) (0.743 µm) | <0.001 |
| Group A (0.089 µm) versus Subgroup BF (Po) (0.386 µm) | <0.001 |
| Group A (0.089 µm) versus Subgroup BX (Po) (0.238 µm) | <0.001 |
| Subgroup BX (Pr) (0.743 µm) versus Subgroup BX (Po) (0.238 µm) | <0.001 |
| Subgroup BF (Pr) (0.743 µm) versus Subgroup BF (Po) (0.386 µm) | <0.001 |
| Subgroup BX (Po) (0.238 µm) versus Subgroup BF (Po) (0.386 µm) | <0.001 |
P<0.001 (statistically significant). Pr: Prepolishing; Po: Postpolishing
Pair-wise comparison of the mean surface roughness values (Ra in µM) of enamel for samples in Group B (paired t-test)
| Paired comparison | |
|---|---|
| Subgroup BX (Pr) (0.388 µm) versus Subgroup BX (Po) (0.161 µm) | <0.001 |
| Subgroup BF (Pr) (0.368 µm) versus Subgroup BF (Po) (0.198 µm) | <0.001 |
| Subgroup BX (Po) (0.161 µm) versus Subgroup BF (Po) (0.198 µm) | >0.001 |
P<0.001 (statistically significant); P>0.001 (statistically nonsignificant). Pr: Prepolishing; Po: Postpolishing
Figure 1Scanning electron microscopy images of composite surface at ×3000. (a) Scanning electron microscopy image of composite surface with Mylar matrix (Ra = 0.088). (b) Scanning electron microscopy image of unpolished composite surface matrix (Ra = 0.767). (c) Scanning electron microscopy image of composite surface polished with Sof-Lex polishing system (Ra = 0.241). (d) Scanning electron microscopy image of composite surface polished with Shofu composite polishing system (Ra = 0.388)
Figure 2Scanning electron microscopy images of enamel surface at ×3000. (a) Scanning electron microscopy image of unpolished enamel (Ra = 0.366). (b) Scanning electron microscopy image of enamel polished with Sof-Lex polishing system (Ra = 0.164). (c) Scanning electron microscopy image of enamel polished with Shofu composite polishing system (Ra = 0.198)