Literature DB >> 31330687

Deep neural networks for classifying complex features in diffraction images.

Julian Zimmermann1, Bruno Langbehn2, Riccardo Cucini3, Michele Di Fraia3,4, Paola Finetti3, Aaron C LaForge5, Toshiyuki Nishiyama6, Yevheniy Ovcharenko2,7, Paolo Piseri8, Oksana Plekan3, Kevin C Prince3,9, Frank Stienkemeier5, Kiyoshi Ueda10, Carlo Callegari3,4, Thomas Möller2, Daniela Rupp1.   

Abstract

Intense short-wavelength pulses from free-electron lasers and high-harmonic-generation sources enable diffractive imaging of individual nanosized objects with a single x-ray laser shot. The enormous data sets with up to several million diffraction patterns present a severe problem for data analysis because of the high dimensionality of imaging data. Feature recognition and selection is a crucial step to reduce the dimensionality. Usually, custom-made algorithms are developed at a considerable effort to approximate the particular features connected to an individual specimen, but because they face different experimental conditions, these approaches do not generalize well. On the other hand, deep neural networks are the principal instrument for today's revolution in automated image recognition, a development that has not been adapted to its full potential for data analysis in science. We recently published [Langbehn et al., Phys. Rev. Lett. 121, 255301 (2018)PRLTAO0031-900710.1103/PhysRevLett.121.255301] the application of a deep neural network as a feature extractor for wide-angle diffraction images of helium nanodroplets. Here we present the setup, our modifications, and the training process of the deep neural network for diffraction image classification and its systematic bench marking. We find that deep neural networks significantly outperform previous attempts for sorting and classifying complex diffraction patterns and are a significant improvement for the much-needed assistance during postprocessing of large amounts of experimental coherent diffraction imaging data.

Entities:  

Year:  2019        PMID: 31330687     DOI: 10.1103/PhysRevE.99.063309

Source DB:  PubMed          Journal:  Phys Rev E        ISSN: 2470-0045            Impact factor:   2.529


  5 in total

1.  Classification of diffraction patterns using a convolutional neural network in single-particle-imaging experiments performed at X-ray free-electron lasers.

Authors:  Dameli Assalauova; Alexandr Ignatenko; Fabian Isensee; Darya Trofimova; Ivan A Vartanyants
Journal:  J Appl Crystallogr       Date:  2022-04-22       Impact factor: 4.868

2.  Selecting XFEL single-particle snapshots by geometric machine learning.

Authors:  Eduardo R Cruz-Chú; Ahmad Hosseinizadeh; Ghoncheh Mashayekhi; Russell Fung; Abbas Ourmazd; Peter Schwander
Journal:  Struct Dyn       Date:  2021-02-18       Impact factor: 2.920

3.  Noise reduction and mask removal neural network for X-ray single-particle imaging.

Authors:  Alfredo Bellisario; Filipe R N C Maia; Tomas Ekeberg
Journal:  J Appl Crystallogr       Date:  2022-02-01       Impact factor: 3.304

4.  Unsupervised learning approaches to characterizing heterogeneous samples using X-ray single-particle imaging.

Authors:  Yulong Zhuang; Salah Awel; Anton Barty; Richard Bean; Johan Bielecki; Martin Bergemann; Benedikt J Daurer; Tomas Ekeberg; Armando D Estillore; Hans Fangohr; Klaus Giewekemeyer; Mark S Hunter; Mikhail Karnevskiy; Richard A Kirian; Henry Kirkwood; Yoonhee Kim; Jayanath Koliyadu; Holger Lange; Romain Letrun; Jannik Lübke; Abhishek Mall; Thomas Michelat; Andrew J Morgan; Nils Roth; Amit K Samanta; Tokushi Sato; Zhou Shen; Marcin Sikorski; Florian Schulz; John C H Spence; Patrik Vagovic; Tamme Wollweber; Lena Worbs; P Lourdu Xavier; Oleksandr Yefanov; Filipe R N C Maia; Daniel A Horke; Jochen Küpper; N Duane Loh; Adrian P Mancuso; Henry N Chapman; Kartik Ayyer
Journal:  IUCrJ       Date:  2022-01-11       Impact factor: 4.769

5.  The Scatman: an approximate method for fast wide-angle scattering simulations.

Authors:  Alessandro Colombo; Julian Zimmermann; Bruno Langbehn; Thomas Möller; Christian Peltz; Katharina Sander; Björn Kruse; Paul Tümmler; Ingo Barke; Daniela Rupp; Thomas Fennel
Journal:  J Appl Crystallogr       Date:  2022-09-14       Impact factor: 4.868

  5 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.