| Literature DB >> 31326027 |
Saskia Lippens1, Anna Kremer2, Peter Borghgraef2, Christopher J Guérin2.
Abstract
There are different technologies that can be used to obtain a 3D image at nanometer resolution. Over the past decade, there has been a growing interest in applying Serial Block Face Scanning Electron Microscopy (SBF-SEM) in different fields of life science research. This technology has the advantage that it can cover a range of volumes, going from monolayers to multiple tissue layers in all three dimensions. SBF-SEM was originally used in neuroscience and then expanded to other research domains. The whole process of sample preparation for SBF-SEM is very long and consists of many steps, which makes adjustment of a given workflow very challenging. Here we describe the SBF-SEM workflow and those steps in the process that can be tweaked for any sample.Keywords: Focal charge compensator; Sample preparation; Serial block-face scanning electron microscopy; Three dimensional electron microscopy; Volume electron microscopy
Mesh:
Year: 2019 PMID: 31326027 DOI: 10.1016/bs.mcb.2019.04.002
Source DB: PubMed Journal: Methods Cell Biol ISSN: 0091-679X Impact factor: 1.441