Literature DB >> 31310091

Focused Electron Beam-Induced Deposition and Post-Growth Purification Using the Heteroleptic Ru Complex (η3-C3H5)Ru(CO)3Br.

Jakub Jurczyk1,2, Christopher R Brewer3, Olivia M Hawkins3, Mikhail N Polyakov1, Czeslaw Kapusta2, Lisa McElwee-White3, Ivo Utke1.   

Abstract

Focused electron beam-induced deposition using the heteroleptic complex (η3-C3H5)Ru(CO)3Br as a precursor resulted in deposition of material with Ru content of 23 at. %. Transmission electron microscopy images indicated a nanogranular structure of pure Ru nanocrystals, embedded into a matrix containing carbon, oxygen, and bromine. The deposits were purified by annealing in a reactive 98% N2/2% H2 atmosphere at 300 °C, resulting in a reduction of contaminants and an increase of the Ru content to 83 at. %. Although a significant volume loss of 79% was found, the shrinkage was observed mostly for vertical thickness (around 75%). The lateral dimensions decreased much less significantly (around 9%). Deposition results, in conjunction with previous gas-phase and condensed-phase surface studies on the electron-induced reactions of (η3-C3H5)Ru(CO)3Br, provide insights into the behavior of allyl, carbonyl, and bromide ligands under identical electron beam irradiation.

Entities:  

Keywords:  focused electron beam induced deposition; mask repair; post-growth purification; precursor compounds; ruthenium

Year:  2019        PMID: 31310091     DOI: 10.1021/acsami.9b07634

Source DB:  PubMed          Journal:  ACS Appl Mater Interfaces        ISSN: 1944-8244            Impact factor:   9.229


  2 in total

Review 1.  Mechanical Properties of 3D Nanostructures Obtained by Focused Electron/Ion Beam-Induced Deposition: A Review.

Authors:  Ivo Utke; Johann Michler; Robert Winkler; Harald Plank
Journal:  Micromachines (Basel)       Date:  2020-04-10       Impact factor: 2.891

2.  In Situ Time-of-Flight Mass Spectrometry of Ionic Fragments Induced by Focused Electron Beam Irradiation: Investigation of Electron Driven Surface Chemistry inside an SEM under High Vacuum.

Authors:  Jakub Jurczyk; Lex Pillatsch; Luisa Berger; Agnieszka Priebe; Katarzyna Madajska; Czesław Kapusta; Iwona B Szymańska; Johann Michler; Ivo Utke
Journal:  Nanomaterials (Basel)       Date:  2022-08-06       Impact factor: 5.719

  2 in total

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