| Literature DB >> 31274422 |
Joakim Laksman1, Jens Buck2, Leif Glaser2, Marc Planas1, Florian Dietrich1, Jia Liu1, Theophilos Maltezopoulos1, Frank Scholz2, Jörn Seltmann2, Gregor Hartmann2, Markus Ilchen1, Wolfgang Freund1, Naresh Kujala1, Jens Viefhaus2, Jan Grünert1.
Abstract
Commissioning and first operation of an angle-resolved photoelectron spectrometer for non-invasive shot-to-shot diagnostics at the European XFEL soft X-ray beamline are described. The objective with the instrument is to provide the users and operators with reliable pulse-resolved information regarding photon energy and polarization that opens up a variety of applications for novel experiments but also hardware optimization.Keywords: EuXFEL; FEL; photoelectron spectrometer; photon diagnostics; polarimeter
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Year: 2019 PMID： 31274422 DOI： 10.1107/S1600577519003552
Source DB: PubMed Journal: J Synchrotron Radiat ISSN： 0909-0495 Impact factor: 2.616