| Literature DB >> 31248131 |
Fuhe Liu1,2, Zhifeng Cheng3, Ping Jia4,5, Bao Zhang6,7, Xiaofeng Liu8,9, Rizha Hu10.
Abstract
The image resolution is the most important performance parameter for an aerial optoelectronic sensor. Existing thermal control methods cannot eliminate the sensor's temperature gradient, making the image resolution difficult to further improve. This article analyzes the different impacts of temperature changes on the imaging resolution and proposes modifications. Firstly, the sensor was subjected to thermo-optical simulation by means of finite element analysis, and the different impacts of temperature changes on the imaging quality were analyzed. According to the simulation results, an active thermal control method is suggested to enhance the temperature uniformity of the sensor. Considering the impacts of active and passive thermal control measures, thermal optical analysis was carried out to predict the performance of the sensor. The results of the analysis show that the imaging quality of the sensor has been significantly improved. The experimental results show that the image resolution of the optoelectronic sensor improved from 47 to 59 lp/mm, which demonstrates that the sensor can produce a high image quality in a low-temperature environment.Entities:
Keywords: image analysis; remote sensor; temperature; thermal effects
Year: 2019 PMID: 31248131 PMCID: PMC6631959 DOI: 10.3390/s19122753
Source DB: PubMed Journal: Sensors (Basel) ISSN: 1424-8220 Impact factor: 3.576
Figure 1Original thermal control design of the optoelectronic sensor.
Figure 2Schematic of the ground resolution test.
Temperature under the thermal control.
| Sensor Location | Temperature (°C) |
|---|---|
| Primary mirror | −8.3 |
| Secondary mirror | −14.9 |
| Main tube | −8.5 |
| Lens barrel | −7.6 |
Figure 3Images obtained at different temperatures: (a) at the initial temperature; (b) at a cold temperature after 1 h.
Figure 4Model of the optoelectronic sensor for thermal analysis.
Analysis of third-order aberrations.
| SA | TCO | TAS | SAS | |
|---|---|---|---|---|
| (a) Temperature level difference of 20 °C | ||||
| 1 | −3.366 | 0.936 | −0.038 | −0.007 |
| 2 | 1.909 | −0.451 | 0.027 | 0.002 |
| 3 | 0.042 | −0.019 | 0.001 | 0.003 |
| 4 | 0.017 | 0.008 | 0.002 | 0.001 |
| 5 | 0.048 | 0.087 | 0.078 | 0.036 |
| 6 | −0.023 | −0.036 | −0.051 | −0.015 |
| 7 | −0.239 | −0.172 | −0.037 | −0.022 |
| 8 | 0.004 | 0.013 | 0.032 | 0.005 |
| 9 | −0.004 | 0.017 | −0.009 | 0.003 |
| 10 | 0.135 | 0.092 | 0.023 | 0.011 |
| 11 | −0.009 | 0.021 | −0.006 | −0.002 |
| 12 | 0.018 | −0.015 | 0.005 | 0.006 |
| Sum | −1.468 | 0.481 | 0.066 | 0.021 |
| (b) Temperature gradient of 20 °C | ||||
| 1 | −3.985 | 1.539 | −0.361 | −0.093 |
| 2 | 2.297 | −0.885 | 0.236 | 0.003 |
| 3 | 0.061 | −0.092 | 0.043 | 0.009 |
| 4 | 0.013 | 0.035 | 0.027 | 0.012 |
| 5 | 0.082 | 0.405 | 0.056 | 0.237 |
| 6 | −0.032 | −0.205 | −0.576 | −0.573 |
| 7 | −0.121 | −0.243 | −0.529 | −0.162 |
| 8 | 0.019 | 0.103 | 0.231 | 0.006 |
| 9 | −0.013 | 0.075 | −0.132 | 0.063 |
| 10 | 0.098 | 0.274 | 0.285 | 0.097 |
| 11 | −0.008 | 0.047 | −0.139 | −0.003 |
| 12 | 0.037 | −0.066 | 0.103 | 0.035 |
| Sum | −1.552 | 0.987 | −0.756 | −0.369 |
Figure 5Analysis of temperature distribution after 1 h.
Third-order aberration analysis in the original thermal control state.
| SA | TCO | TAS | SAS | |
|---|---|---|---|---|
| 1 | −5.359 | 1.623 | −0.164 | −0.021 |
| 2 | 2.891 | −0.563 | 0.035 | 0.008 |
| 3 | 0.068 | −0.024 | 0.008 | 0.009 |
| 4 | 0.023 | 0.012 | 0.006 | 0.005 |
| 5 | 0.057 | 0.095 | 0.086 | 0.053 |
| 6 | −0.033 | −0.041 | −0.072 | −0.022 |
| 7 | −0.265 | −0.187 | −0.043 | −0.036 |
| 8 | 0.007 | 0.027 | 0.039 | 0.008 |
| 9 | −0.015 | 0.031 | −0.024 | 0.011 |
| 10 | 0.215 | 0.125 | 0.037 | 0.023 |
| 11 | −0.015 | 0.033 | −0.022 | −0.018 |
| 12 | 0.021 | −0.032 | 0.021 | 0.031 |
| Sum | −2.405 | 1.123 | −0.093 | 0.053 |
Figure 6Schematic of the active thermal measure. (a) Heating films on the optical systems; (b) heating films on the insulation layer.
Figure 7Feedback loop of the thermal control system.
Third-order aberration analysis based on the modified thermal control measures.
| SA | TCO | TAS | SAS | |
|---|---|---|---|---|
| 1 | −2.085 | 0.351 | −0.159 | −0.016 |
| 2 | 1.093 | −0.216 | 0.047 | 0.007 |
| 3 | 0.057 | −0.022 | 0.009 | 0.017 |
| 4 | 0.019 | 0.011 | 0.005 | 0.013 |
| 5 | 0.058 | 0.088 | 0.075 | 0.028 |
| 6 | −0.029 | −0.035 | −0.098 | −0.015 |
| 7 | −0.158 | −0.101 | −0.040 | −0.041 |
| 8 | 0.009 | 0.032 | 0.035 | 0.009 |
| 9 | −0.016 | 0.017 | −0.033 | 0.018 |
| 10 | 0.117 | 0.102 | 0.052 | 0.036 |
| 11 | −0.012 | 0.029 | −0.078 | −0.025 |
| 12 | 0.018 | −0.018 | 0.009 | 0.029 |
| Sum | −0.927 | 0.238 | −0.136 | 0.061 |
Figure 8Temperature changes of the primary mirror and the secondary mirror during the test.
Figure 9Image resolution of the sensor during the test.
Figure 10Images obtained at different temperatures: (a) at the initial temperature; (b) at low temperatures after 1 h.