Literature DB >> 31244261

Scanning Spreading Resistance Microscopy: A Promising Tool for Probing the Reaction Interface of Li-Ion Battery Materials.

Mitsunori Kitta1, Chie Fukada1.   

Abstract

Imaging of the Li-insertion/extraction [Li-in/out] interface of the electrode materials of Li-ion batteries is essential to reveal their bulk mechanism of electrochemical reaction and phase behavior in the crystal. Generally, the material properties significantly change at this interface. Therefore, direct probing of the changing properties is a promising approach to reliably investigate the Li-in/out interface in the bulk crystal of electrode materials. In this study, we investigated the change in electron conductivity of rutile-TiO2 with Li-insertion and extraction, as a model for the electrochemical interface of a bulk crystal of electrode material. In addition, we probed the interface using logarithm contact resistance [log  R (Ω)] imaging via scanning spreading resistance microscopy (SSRM). A distinct Li-in/out interface on the rutile-TiO2(001) wafer was observed using this technique. The imaging resolution of this region was estimated to be approximately 40-50 nm in SSRM images, which was two to three times higher than the resolution of the topographic image (100-150 nm), which was restricted to the curvature radius of the SSRM probe tip. A high spatial resolution was obtained via SSRM imaging because this approach is not influenced by the geometric effects of the surface. This result demonstrated the potential of SSRM imaging for the study of the Li-in/out interface.

Entities:  

Year:  2019        PMID: 31244261     DOI: 10.1021/acs.langmuir.9b00971

Source DB:  PubMed          Journal:  Langmuir        ISSN: 0743-7463            Impact factor:   3.882


  1 in total

1.  Boosting the performance of NO2 gas sensors based on n-n type mesoporous ZnO@In2O3 heterojunction nanowires: in situ conducting probe atomic force microscopic elucidation of room temperature local electron transport.

Authors:  Ramakrishnan Vishnuraj; Karthikeyan K Karuppanan; Mahaboobbatcha Aleem; Biji Pullithadathil
Journal:  Nanoscale Adv       Date:  2020-08-12
  1 in total

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