| Literature DB >> 31235853 |
Maksim Melnik1, Irina Vorontsova2, Sergey Putilin2, Anton Tcypkin2, Sergei Kozlov2.
Abstract
Modern sources of THz radiation generate high-intensity pulses allowing to observe nonlinear effects in this spectral range. To describe many nonlinear effects theoretically, it is necessary to know the nonlinear refractive index coefficient of optical materials. The work studies the applicability of the Z-scan method to determine the nonlinear refractive index coefficient in the THz frequency range for few-cycle pulses. We have discussed the correctness of the known Z-scan method for calculating the nonlinear refractive index coefficient for broadband THz radiation regarding number of cycles pulses have. We have demonstrated that the error in determining the nonlinear refractive index coefficient is always greater than 70% for true single-cycle pulses. With the increase in the number of oscillations to the measurement error shows strong dependence on the sample thickness and can vary from 2% to 90% regarding the parameters chosen. The fact that such radiation dispersion length is commensurate with the nonlinear length or even less than the latter results in the discrepancy mentioned. It is demonstrated that the decrease in the sample thickness leads to the reduction of the nonlinear refractive index coefficient determination error, and this error is <2% when the ratio between the sample thickness and the pulse longitudinal spatial size is ≤1. This can relate to the fact that the nonlinear effects in such a thin sample occur faster than the dispersion ones.Entities:
Year: 2019 PMID: 31235853 PMCID: PMC6591171 DOI: 10.1038/s41598-019-45735-6
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Z-scan curves (colored) obtained through the numerical simulation of the method (see Methods) for (a) 1 and 10T0 and (b) 0.3T0 pulses for the central wavelength λ0 = 0.3 mm and crystal thickness of 0.3 mm; black curve corresponds to the analytical model for monochromatic THz radiation.
Figure 2Dependence of n2 measurement error on the number of THz pulse periods for a fixed thickness of the sample L = 0.3 mm and pulse wavelengths λ0 = 0.3 mm and 0.4 mm.
Figure 3The dependence of n2 measurement error on the value of the L/x ratio.
Figure 4(a) Visual representation of the Z-scan method for the THz pulsed radiation propagating at the distance from z− to z+: for each position of the crystal the THz pulse was distributed through the air, the crystal itself and then further through the remaining distance in air to be finally captured at the detector, placed at z+. The distance of propagation corresponds to two focal lengths. Single-cycle (b,c) and multi-cycle (f,g) THz pulses representation at the input and in the focus correspondingly; (d,h) cross-sections of their electric field profiles correspondingly; (e,i) their spectra.