| Literature DB >> 31212926 |
Mizue Mizoshiri1, Keiko Aoyama2, Akira Uetsuki3, Tomoji Ohishi4.
Abstract
We have fabricated Cu-based micropatterns in an ambient environment using femtosecond laser direct writing to reduce a glyoxylic acid Cu complex spin-coated onto a glass substrate. To do this, we scanned a train of focused femtosecond laser pulses over the complex film in air, following which the non-irradiated complex was removed by rinsing the substrates with ethanol. A minimum line width of 6.1 µm was obtained at a laser-pulse energy of 0.156 nJ and scanning speeds of 500 and 1000 µm/s. This line width is significantly smaller than that obtained in previous work using a CO2 laser. In addition, the lines are electrically conducting. However, the minimum resistivity of the line pattern was 2.43 × 10-6 Ω·m, which is ~10 times greater than that of the pattern formed using the CO2 laser. An X-ray diffraction analysis suggests that the balance between reduction and re-oxidation of the glyoxylic acid Cu complex determines the nature of the highly reduced Cu patterns in the ambient air.Entities:
Keywords: Cu micropattern; femtosecond laser; glyoxylic acid Cu complex; laser direct writing; reduction
Year: 2019 PMID: 31212926 PMCID: PMC6631329 DOI: 10.3390/mi10060401
Source DB: PubMed Journal: Micromachines (Basel) ISSN: 2072-666X Impact factor: 2.891
Figure 1(a) Spin-coating of a glyoxylic acid Cu (GACu) complex film on a glass substrate. (b) Femtosecond-laser direct writing by reduction of the GACu complex film. (c) Nonirradiated GACu complex removed by rinsing the substrate with ethanol.
Figure 2Absorption spectrum of GACu complex thin film.
Figure 3(a) Relationship between line width and laser irradiation conditions, (b) optical microscope image at scanning speed of 1000 µm/s and various pulse energies, and (c) field-emission scanning electron microscopy (FE-SEM) image showing the line width obtained when using a pulse energy of 0.156 nJ and scanning speed of 500 µm/s.
Figure 4(a) Optical microscope image of a typical line pattern connecting two Cu thin film pads. (b) Resistivity of micropatterns fabricated under various laser irradiation conditions. (c) Cross-sectional profile of a line pattern produced at scanning speed of 500 µm/s and pulse energy of 0.468 nJ.
Figure 5XRD spectra of fabricated micropatterns at a scanning speed of (a) 300 µm/s, (b) 500 µm/s, and (c) 1000 µm/s. (d) Intensity ratio of Cu2O to Cu as a function of pulse energy.