| Literature DB >> 31202262 |
Li-Jia Dong1,2, Wei-Ming He3,4.
Abstract
BACKGROUND: Invasive plants commonly occupy diverse habitats and thus must adapt to changing environmental pressures through altering their traits and economics spectra, and addressing these patterns and their drivers has an importantly ecological and/or evolutionary significance. However, few studies have considered the role of multiple biotic and abiotic factors in shaping trait variation and spectra. In this study, we determined seven leaf traits of 66 Solidago canadensis populations, and quantified the relative contributions of climate, soil properties, native plant diversity, and S. canadensis-community interactions (in total 16 factors) to leaf trait variation and spectrum with multimodel inference.Entities:
Keywords: Climate; Invader–community interactions; Invasive plants; Multimodel inference; Native plant diversity; Soil properties
Mesh:
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Year: 2019 PMID: 31202262 PMCID: PMC6570854 DOI: 10.1186/s12898-019-0240-1
Source DB: PubMed Journal: BMC Ecol ISSN: 1472-6785 Impact factor: 2.964
Fig. 1The boxplot of phenotypic variation index of seven leaf traits. LDMC, leaf dry matter content; SLA, specific leaf area. The different letters indicate significant differences at the P = 0.05 level
Fig. 2The relative contributions of 16 environmental factors to the variation in leaf dry matter content (a), leaf area (b), specific leaf area (c), leaf C:N ratio (d), leaf N (e), leaf chlorophyll index (f), and leaf C (g). The positive/negative direction of each effect is indicated by its positive/negative value. ***P < 0.001; **P < 0.01; *P < 0.05
Fig. 3The relationship between leaf production index and leaf stress-tolerance index (a) and the relative contributions of 16 environmental factors to leaf production-tolerance trade-off (b). The positive/negative direction of each effect is indicated by its positive/negative value. ***P < 0.001; **P < 0.01; *P < 0.05
Fig. 4An illustration of 22 sampling locations and 66 sampling sites in our study (a) and plot layout (b)