| Literature DB >> 31185661 |
Jun-Jie Chang1,2,3, Yuan-Yuan Li4,5, Xue-Feng Zeng6,7, Hai-Ying Zhong8, Tao-Lei Wan9,10, Chao Lu11.
Abstract
The reflected waves received from ultrasonic waves propagating in materials contain information that constitutes the physical properties, material composition, defects, and degradation states. When measuring the dynamic viscoelasticity, the traditional bottom reflection method (BRM) cannot be used to measure the bottom irregular samples. In this paper, the storage modulus, loss modulus, and loss tangent are extracted by the surface reflection method (SRM) to evaluate the elastomer sample viscoelasticity. A theoretical study on the phase change caused by multiple reflections in the case of non-thin layer coupling is conducted. Based on this research, the experimental system is built. The results show that considering the thickness of the coupling layer can optimize the determination of viscoelasticity and reduce the error of the viscoelastic evaluation results of an elastomer with the traditional BRM. Finally, based on the principle of the SRM, the density of the elastomers is measured, and the feasibility and overall efficiency of this method are verified by experiments.Entities:
Keywords: SRM; complex reflectivity; dynamic viscoelasticity; parameter optimization
Year: 2019 PMID: 31185661 PMCID: PMC6601282 DOI: 10.3390/ma12111875
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Figure 1Schematic diagram of the surface reflection measurement principle for measuring the complex reflection coefficient: (a) with no sample: reflected wave A0 of buffer and the air interface; (b) with a sample: reflected wave A of buffer and the sample interface, and reflected wave B of sample and the air interface.
Figure 2Effect of the coupling layer: coupling layer thickness is h and the medium is water.
Figure 3Loss tangent curve of the dynamic mechanical analysis (DMA) method and the bottom reflection method (BRM) in the effective frequency range of 0.5–1.5 MHz.
Figure 4The flowchart of the process adopted for research on viscoelasticity. EPDM = ethylene propylene diene monomer; SBR = styrene butadiene rubber.
Figure 5Schematic diagram of the simulation model by the PZflex method and wave propagation process with 50 μm-thick aqueous medium and absorption boundary.
Figure 6Received waveform of the same 13 mm-thick polymethyl methacrylate (PMMA) and 10 mm-thick EPDM material (1 MHz): (a) the reflection wave from the bottom of the buffer with simulation; (b) the reflection wave from the surface and bottom of the sample with simulation.
Figure 7Linear approximation of the SRM and BRM simulation results for different kinds of rubber materials: (a) analysis of storage modulus results; (b) analysis of loss modulus results; (c) analysis of loss tangent results.
Figure 8Schematic diagram of the experimental setup.
Figure 9Received waveform of the same 13 mm-thick PMMA and 10 mm-thick EPDM material (1 MHz) by experiment: (a) the reflection wave form of the bottom of the buffer with an experiment; (b) the reflection wave form of the surface and bottom of the sample with an experiment.
Figure 10Linear approximation of the SRM and BRM experimental results for different kinds of rubber materials: (a) analysis of storage modulus results; (b) analysis of loss modulus results; (c) analysis of loss tangent results.
Density calculated by reflection coefficient (longitudinal wave 1 MHz). Sample materials are represented by sample name (column 1), among which EPX series belongs to the EPDM material mentioned above, OR series belongs to SBR1 material, and ORHS series belongs to SBR2 material. They are all named according to the hardness of the material, the physical properties of the filling material, etc.
| Materials | Density by Reflection Coefficient (g/cm3) | Density by the Archimedes Method (g/cm3) | Difference (%) |
|---|---|---|---|
| EPX24 | 0.90 | 0.93 | 2.9 |
| EPX46 | 0.95 | 0.98 | 3.2 |
| EPX45 | 0.98 | 1.02 | 3.6 |
| OR3C | 0.98 | 1.04 | 5.5 |
| OR3Si | 1.03 | 1.07 | 3.7 |
| OR4C | 1.01 | 1.06 | 4.6 |
| OR4Si | 1.05 | 1.08 | 2.6 |
| ORHS3C | 0.93 | 1.03 | 9.7 |
| ORHS3Si | 0.93 | 1.02 | 8.8 |
| ORHS4C | 0.95 | 1.05 | 9.5 |
| ORHS4Si | 0.96 | 1.07 | 10.2 |