Literature DB >> 31141672

Correlated Nanoscale Analysis of the Emission from Wurtzite versus Zincblende (In,Ga)As/GaAs Nanowire Core-Shell Quantum Wells.

Jonas Lähnemann1, Megan O Hill2, Jesús Herranz1, Oliver Marquardt3, Guanhui Gao1, Ali Al Hassan4, Arman Davtyan4, Stephan O Hruszkewycz5, Martin V Holt6, Chunyi Huang2, Irene Calvo-Almazán5, Uwe Jahn1, Ullrich Pietsch4, Lincoln J Lauhon2, Lutz Geelhaar1.   

Abstract

While the properties of wurtzite GaAs have been extensively studied during the past decade, little is known about the influence of the crystal polytype on ternary (In,Ga)As quantum well structures. We address this question with a unique combination of correlated, spatially resolved measurement techniques on core-shell nanowires that contain extended segments of both the zincblende and wurtzite polytypes. Cathodoluminescence hyperspectral imaging reveals a blue-shift of the quantum well emission energy by 75 ± 15 meV in the wurtzite polytype segment. Nanoprobe X-ray diffraction and atom probe tomography enable k·p calculations for the specific sample geometry to reveal two comparable contributions to this shift. First, there is a 30% drop in In mole fraction going from the zincblende to the wurtzite segment. Second, the quantum well is under compressive strain, which has a much stronger impact on the hole ground state in the wurtzite than in the zincblende segment. Our results highlight the role of the crystal structure in tuning the emission of (In,Ga)As quantum wells and pave the way to exploit the possibilities of three-dimensional band gap engineering in core-shell nanowire heterostructures. At the same time, we have demonstrated an advanced characterization toolkit for the investigation of semiconductor nanostructures.

Entities:  

Keywords:  (In,Ga)As quantum well; Nanowire; atom probe tomography; cathodoluminescence; nanofocused X-ray diffraction; polytype

Year:  2019        PMID: 31141672     DOI: 10.1021/acs.nanolett.9b01241

Source DB:  PubMed          Journal:  Nano Lett        ISSN: 1530-6984            Impact factor:   11.189


  1 in total

1.  Beam damage of single semiconductor nanowires during X-ray nanobeam diffraction experiments.

Authors:  Ali Al Hassan; Jonas Lähnemann; Arman Davtyan; Mahmoud Al-Humaidi; Jesús Herranz; Danial Bahrami; Taseer Anjum; Florian Bertram; Arka Bikash Dey; Lutz Geelhaar; Ullrich Pietsch
Journal:  J Synchrotron Radiat       Date:  2020-08-12       Impact factor: 2.616

  1 in total

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