| Literature DB >> 31138791 |
Jaegeon Ryu1, Ji Hui Seo2, Gyujin Song2, Keunsu Choi2, Dongki Hong2, Chongmin Wang3, Hosik Lee4, Jun Hee Lee5, Soojin Park6.
Abstract
A fast-chargEntities:
Year: 2019 PMID: 31138791 PMCID: PMC6538609 DOI: 10.1038/s41467-019-10289-8
Source DB: PubMed Journal: Nat Commun ISSN: 2041-1723 Impact factor: 14.919
Fig. 1Structural evolution and characterization of quasi-metallic silicon. a, b Schematic of each stage for (a) QMS and (b) bare Si. c Scanning transmission electron microscopy (STEM) image. d, e Corresponding energy-dispersive X-ray spectroscopy (EDS) maps for (d) Si and (e) sulfur. f EELS spectra for elemental sulfur, bare Si, and QMS (inset: STEM image of the EELS measurement position). g, h High-magnification STEM images of QMS. Scale bars, 1 μm (c–e); 50 nm (f); 5 Å (g, h)
Fig. 2Metallicity of quasi-metallic silicon. a, b Single-particle I–V plots (a) and bulk (pellet) conductivity results (b) of bare Si, carbon-coated Si(Si@C), QMS(0.1), QMS(0.3), and QMS(0.7) samples. c, e Calculated band structure of QMS samples with different substitution doping concentrations of (c) 0.39%, S1Si255, and (e) 1.59%, S1Si63. The charge density distribution at these impurity levels (in the insets) is shown in red and blue lines to intuitively illustrate the contribution of Si to the metallic properties. The isosurface of the density is 0.0005 e/Å3. d Hall effect measurement results of QMS(0.7)
Fig. 3Sulfur-fusion-induced channel formation in quasi-metallic silicon. a HR-TEM image of QMS (inset: corresponding fast fourier transform image). b Enlarged TEM image showing column formation between characteristic Si (111) planes. c Intensity profiles of selected areas in (a). d XRD patterns of Si and a series of QMS between 27.6–29.2°. e Sulfur chain structure under applied pressure depending on different channel sizes, as calculated by DFT. f Li-ion diffusion coefficient versus the state of charge (SOC) during the first cycle. Scale bars, 2 nm (a); 1 nm (b)
Fig. 4Lithium sulfide formation inside quasi-metallic silicon. a–f TEM images, and corresponding selected area diffraction patterns for (a, d) pristine, (b, e) fully lithiated, and (c, f) fully delithiated states of QMS particle. g, h HR-TEM image and corresponding elemental maps for Si and S (g) and EELS spectrum (h) of QMS after cycles and SEI elimination. Scale bars, 500 nm (a, c, e); 2 1/nm (b, d, f); 5 nm (g)
Fig. 5Li-ion storage properties of quasi-metallic silicon and Si electrodes. a First charge–discharge profiles of QMS(0.7) and Si electrodes at a C-rate of 0.05 C. b Charge areal capacity retention of both electrodes at 0.5 C with the corresponding Coulombic efficiency. c Specific capacity plots for both electrodes at different C-rates from 0.2 C to 5 C. d Electrode expansion ratio during 300 cycles for both electrodes. e Full-cell cycle retention at 1 C (3.3 mA cm−2) along with the coulombic efficiency