| Literature DB >> 31061512 |
Jiabao Zheng1, Benjamin Lienhard2, Gregory Doerk3, Mircea Cotlet3, Eric Bersin2, Harrison Sejoon Kim4, Young-Chul Byun4, Chang-Yong Nam3, Jiyoung Kim4, Charles T Black3, Dirk Englund5.
Abstract
Nanodiamonds hosting colour centres are a promising material platform for various quantum technologies. The fabrication of non-aggregated and uniformly-sized nanodiamonds with systematic integration of single quantum emitters has so far been lacking. Here, we present a top-down fabrication method to produce 30.0 ± 5.4 nm uniformly-sized single-crystal nanodiamonds by block copolymer self-assembled nanomask patterning together with directional and isotropic reactive ion etching. We show detected emission from bright single nitrogen vacancy centres hosted in the fabricated nanodiamonds. The lithographically precise patterning of large areas of diamond by self-assembled masks and their release into uniformly sized nanodiamonds open up new possibilities for quantum information processing and sensing.Entities:
Year: 2019 PMID: 31061512 PMCID: PMC6502864 DOI: 10.1038/s41598-019-43304-5
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Fabrication process flow in 8 steps, with colour legend at upper left indicating the material of each layer. Each subfigure corresponds to one fabrication step, with schematic side-view diagram, and text showing the specific process carried out in the particular step, together with SEM images taken after that step, showing resultant device morphology. All scale bars indicate 100 nm. Note that images for steps (a–c) are top view, and images for other steps were obtained with samples tilted at 45 degrees. (a) Polished bulk single crystal diamond, coated with ~30 nm SiO2 layer using PECVD, with AlOx hexagonal dot array patterned by BCP film using spin coating, SA and SIS. (b) Gentle O2 plasma treatment removes the polymer content in the BCP film, leaving AlOx hexagonal dot array pattern. (c) Directional plasma etching of SiO2, transferring the dot array pattern to SiO2 layer. (d) Directional O2 plasma etching of diamond, transferring the dot array pattern to bulk diamond, forming diamond pillars arranged in hexagonal array. (e) ALD of ~2 nm SiO2 coating to protect the sidewall of etched diamond pillars. (f) A short directional plasma etch removes SiO2 from bottom surfaces of the open gaps between diamond pillars. (g) The sample is exposed to a quasi-isotropic O2 plasma to undercut the diamond pillars. (h) The bulk diamond is immersed in HF acid to remove the residue SiO2 layer.
Figure 2(a) SEM of fabricated NDs before release, featuring ~30 nm sized NDs sitting on ~4 nm diamond pedestals. (b) SEM of NDs released on glass substrate. (c) Particle size distribution histogram of NDs, determined from large scale SEM imaging and subsequent image processing to detect the size of the NDs in the SEM image. The red curve shows a Gaussian fit to the histogram with a mean diameter of 30 nm and a variance of 5.4 nm. (d) Optical confocal scanning image of the NDs released on glass substrate. The bright spot (white dashed circle) indicates an ND hosting a single NV colour centre. (e) Photoluminescence spectrum collected from the bright spot shown in (d), with the characteristic NV zero phonon line (ZPL) at 636.5 nm and a broad phonon sideband. (f) Second-order autocorrelation histogram of the collected emission from the bright spot in (d), showing g2(0) of 0.08 indicating single photon emission (g2(0) < 0.5).